Multi-stage analog to digital converter

Patent metadata

Field	Value
Publication number	US-11057046-B2
Application number	US-202016948288-A
Country	US
Kind code	B2
Filing date	Sep 11, 2020
Priority date	Sep 5, 2019
Publication date	Jul 6, 2021
Grant date	Jul 6, 2021

Abstract

A multi-stage analog-to-digital converter (ADC) suitable for low power applications, such as glucose monitoring, may be required to digitize a slow-moving signal. As such, a multi-stage ADC must be versatile. Accordingly, the multi-stage ADC can be configured to operate at different bandwidths and resolutions through the use of ADC stages that can be enabled or disabled in an exchange between resolution and speed. Each ADC stage digitizes an input signal (e.g., a voltage or a current) using an analog comparison to access a lookup table for a digital signal that represents the input signal at a particular accuracy. Unlike other multi-stage approaches, the digitization is asynchronous (i.e., requires no clock) and can provide simplicity, speed, and low-power operation to the multi-stage ADC.

First claim

The invention claimed is:

1. A multi-stage analog-to-digital converter (ADC) for generating a digital word representing an analog sample of a signal, the multi-stage ADC comprising:
an ADC stage included in a sequence of ADC stages, the ADC stage configured to:
access a lookup-table, based on an input signal received by the ADC stage and a reference level received by the ADC stage, and output a digital word segment corresponding to a level of the input signal relative to the reference level; and

a synchronizing and recording circuit configured to:
combine digital word segments from the sequence of ADC stages to generate the digital word representing the analog sample of the signal.

2. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 1 , wherein the ADC stage includes:
a front-end computing portion configured to:
compare the input signal received by the ADC stage to reference ranges set by the reference level received by the ADC stage, and
generate, based on the comparison, a plurality of signals, each of the plurality of signals representing the input signal compared to one of the reference ranges.

3. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 2 , wherein the front-end computing portion is an asynchronous analog circuit.

4. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 2 , wherein the input signal is a voltage.

5. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 2 , wherein the input signal is a current.

6. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 2 , wherein the ADC stage further includes:
an encoding portion configured to:
retrieve a digital word segment stored in the lookup-table based on the plurality of signals; and
output the digital word segment as a digital signal.

7. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 6 , wherein the ADC stage further includes:
a quantum level computing portion configured to:
generate a next reference level for a next ADC stage in the sequence of ADC stages;
generate a next input signal for the next ADC stage in the sequence of ADC stages; and
transmit the next reference level and the next input signal to the next ADC stage in the sequence of ADC stages.

8. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 1 , wherein digital word segments from the sequence of ADC stages include:
a first digital word segment from a first ADC stage in the sequence of ADC stages; and
a last digital word segment from a last ADC stage in the sequence of ADC stages, the first digital word segment including bits that are more significant than the last digital word segment.

9. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 8 , wherein the synchronizing and recording circuit is configured to:
append the digital word segments from the sequence of ADC stages from the first digital word segment to the last digital word segment.

10. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 9 , wherein the synchronizing and recording circuit is further configured to:
store the appended digital word segments in a memory as the digital word representing the analog sample of the signal.

11. The multi-stage ADC for generating a digital word representing an analog sample of a signal according to claim 1 , wherein the ADC stage in the sequence of ADC stages may be enabled or disabled to increase or decrease a number of ADC stages in the sequence of ADC stages, the number of ADC stages in the sequence of ADC stages corresponding to an accuracy of the digital word representing the analog sample of the signal.

12. A multi-stage analog-to-digital converter (ADC), the multi-stage ADC comprising:
a sequence of ADC stages, each ADC stage including:
a front-end computing portion configured to:
compare an input signal received by the ADC stage to reference ranges set by a reference level received by the ADC stage, and
generate, based on the comparison, a plurality of signals, each of the plurality of signals representing the input signal compared to one of the reference ranges;

an encoding portion configured to:
retrieve a digital word segment stored in a lookup-table based on the plurality of signals, and
output the digital word segment; and

a quantum level computing portion configured to:
generate a next reference level for a next ADC stage in the sequence of ADC stages,
generate a next input signal for the next ADC stage in the sequence of ADC stages, and
transmit the next reference level and the next input signal to the next ADC stage in the sequence of ADC stages.

13. The multi-stage analog-to-digital converter (ADC) according to claim 12 , wherein the front-end computing portion requires no clock signal.

14. The multi-stage analog-to-digital converter (ADC) according to claim 12 , further comprising:
a synchronizing and recording circuit configured to form a digital word representing an analog sample of a signal by appending digital word segments from the sequence of ADC stages.

15. The multi-stage analog-to-digital converter (ADC) according to claim 14 , wherein the digital word segments include:
a first digital word segment that is output from a first ADC stage in the sequence of ADC stages; and
a last digital word segment that is output from a last ADC stage in the sequence of ADC stages, the first digital word segment including bits that are more significant than the last digital word segment.

16. The multi-stage analog-to-digital converter (ADC) according to claim 14 , wherein each ADC stage in the sequence of ADC stages may be enabled or disabled to increase or decrease a number of ADC stages in the sequence of ADC stages.

17. The multi-stage analog-to-digital converter (ADC) according to claim 16 , wherein the number of ADC stages in the sequence of ADC stages corresponds to an accuracy of the digital word representing an analog sample of a signal input to the multi-stage ADC.

18. A method for analog to digital conversion, the method comprising:
determining a first level of an input signal relative to a reference level;
accessing a lookup-table based on the first level to obtain a first digital word segment;
adjusting the input signal and the reference level to obtain an adjusted input signal and an adjusted reference level;
determining a second level of the adjusted input signal relative to the adjusted reference level;
accessing a lookup-table based on the second level to obtain a second digital word segment; and
combining the first digital word segment and the second digital word segment to obtain a digital representation of the input signal.

19. The method for analog to digital conversion according to claim 18 , wherein the combining the first digital word segment and the second digital word segment to obtain a digital representation of the input signal includes:
appending the first digital word segment and the second digital word segment, the first digital word segment including bits that are more significant than the second digital word segment.

20. The method for analog to digit

Assignees

• Semiconductor Components Ind Llc

Inventors

• Milicevic Sinisa

Classifications

• H03M1/124

  Sampling or signal conditioning arrangements specially adapted for A/D converters · CPC title

• H03M1/06

  Continuously compensating for, or preventing, undesired influence of physical parameters (periodically, {e.g. by using stored correction values,} H03M1/10) · CPC title

• H03M1/145

  the steps being performed sequentially in series-connected stages (H03M1/141, H03M1/143, H03M1/16 take precedence) · CPC title

• H03M1/14

  Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit · CPC title

• H03M1/36 Primary

  simultaneously only, i.e. parallel type · CPC title