Microprocessor-assisted calibration for analog-to-digital converter

Patent metadata

Field	Value
Publication number	US-9654133-B2
Application number	US-201514955888-A
Country	US
Kind code	B2
Filing date	Dec 1, 2015
Priority date	Dec 17, 2014
Publication date	May 16, 2017
Grant date	May 16, 2017

Abstract

Analog-to-digital converters (ADCs) can have errors which can affect their performance. To improve the performance, many techniques have been used to compensate or correct for the errors. When the ADCs are being implemented with sub-micron technology, ADCs can be readily and easily equipped with an on-chip microprocessor for performing a variety of digital functions. The on-chip microprocessor and any suitable digital circuitry can implement functions for reducing those errors, enabling certain undesirable artifacts to be reduced, and providing a flexible platform for a highly configurable ADC. The on-chip microprocessor is particularly useful for a randomized time-interleaved ADC. Moreover, a randomly sampling ADC can be added in parallel to a main ADC for calibration purposes. Furthermore, the overall system can include an efficient implementation for correcting errors in an ADC.

First claim

What is claimed is:

1. A time-interleaved analog-to-digital converter comprising:
two or more analog-to-digital converters for sampling, interleaved in time, an analog input signal;
first circuitry for generating measurements by processing a plurality of samples of signals in the two or more analog-to-digital converters and recording the measurements in an on-chip memory accessible by a microprocessor on-chip with the two or more analog-to-digital converters;
the microprocessor for executing instructions stored on-chip configured to carry out one or more calibration algorithms for calculating one or more correction terms based on the measurements; and
second circuitry for correcting one or more signals in the two or more analog-to-digital converters based on the correction terms.

2. The time-interleaved analog-to-digital converter of claim 1 , further comprising:
a clock generator for generating a clock signal for the microprocessor to provide spread spectrum clocking, wherein the clock signal has on average a particular frequency but an instantaneous period of the clock signal is spread over multiple frequencies.

3. The time-interleaved analog-to-digital converter of claim 2 , wherein the clock generator generates clock signals for running one or more of the following: any one or more of the two or more analog-to-digital converters, and a reference analog-to-digital converter sampling in parallel with the two or more analog-to-digital converters.

4. The time-interleaved analog-to-digital converter of claim 1 , wherein the first circuitry for generating the measurements comprises one or more of the following: correlator logic, accumulation logic, decimation logic, absolute value logic, and squaring logic.

5. The time-interleaved analog-to-digital converter of claim 1 , wherein the second circuitry comprises registers for storing correction terms, said registers accessible by or are available to one or more of the following: any one or more of the two or more analog-to-digital converters, the second circuitry, and a reference analog-to-digital converter sampling along with the two or more analog-to-digital converters.

6. The time-interleaved analog-to-digital converter of claim 1 , wherein the instructions includes a code portion selected from a plurality of code portions for different applications, wherein the code portion is selected using one or more of the following: one or more fuses, non-volatile memory, and one or more input pins.

7. The time-interleaved analog-to-digital converter of claim 6 , wherein the code portions correspond to different calibration sequences or different calibration schemes for the time-interleaved analog-to-digital converter.

8. The time-interleaved analog-to-digital converter of claim 1 , wherein the microprocessor polls the on-chip memory for measurements.

9. The time-interleaved analog-to-digital converter of claim 1 , wherein:
the microprocessor asserts a start signal to the first circuitry to initiate processing of signals in the two or more analog-to-digital converters by the second circuitry; and
the second circuitry transmits an interrupt to the microprocessor to signal to the microprocessor that the measurements are ready.

10. The time-interleaved analog-to-digital converter of claim 1 , further comprising:
a digital-to-analog converter having a plurality of bits for generating bits of a random signal being injected into a first one of the two or more analog-to-digital converters; and
a subtraction circuit for subtracting the injected random signal, the subtraction circuit comprising two registers per each bit of the digital-to-analog converter, wherein values stored in the two registers are selectable by a respective bit of the random signal for subtracting the random signal;
wherein:
the second circuitry comprises a correlator and an accumulator block for estimating errors of a particular bit in the digital-to-analog converter; and
the microprocessor updates values stored in the two registers per each bit based on the estimated errors.

11. The time-interleaved analog-to-digital converter of claim 10 , wherein the digital-to-analog converter is configured to toggle between two values corresponding to a bit under calibration every clock cycle, and randomly toggle between two values for other bits on a divide by two clock, to allow an error of the bit under calibration to be measured by the correlator and the accumulator block.

12. A method for assisting a time-interleaved analog-to-digital converter, the method comprising:
executing, by a microprocessor on-chip with the time-interleaved analog-to-digital converter, instructions stored on-chip to calculate coefficients for calibrating the time-interleaved analog-to-digital converter;
processing, by dedicated circuitry, signals in the time-interleaved analog-to-digital converter;
recording, by the dedicated circuitry, measurements of the signals in a memory accessible to the on-chip microprocessor; and
writing, by the on-chip microprocessor, the coefficients to calibration circuitry for adjusting one or more signals in the time-interleaved analog-to-digital converter and correcting one or more errors in the time-interleaved analog-to-digital converter, wherein the coefficients are determined by the on-chip microprocessor based on the measurements and the instructions.

13. The method of claim 12 , further comprising:
detecting, by the on-chip microprocessor, condition(s) in the time-interleaved analog-to-digital converter based on the measurements recorded by the dedicated circuitry; and
adjusting, by the on-chip microprocessor, one or more parts of an adaptation algorithm based on the condition(s) being detected.

14. The method of claim 12 , further comprising:
ensuring, by the on-chip microprocessor, the coefficients being written to the calibration circuitry do not go beyond a suitable range or do meet one or more expected characteristics.

15. The method of claim 12 , further comprising:
adjusting, by the on-chip microprocessor, the dedicated circuitry based on measurements of a state of the time-interleaved analog-to-digital converter, wherein adjusting the dedicated circuitry comprises adjusting a number of samples being used for averaging in an accumulator or a term used for dividing an accumulated value when computing an average.

16. The method of claim 12 , further comprising:
executing, by the on-chip microprocessor, an adaptation algorithm for updating the coefficients being written to the calibration circuitry; and
adjusting, by the on-chip microprocessor, a rate of the adaptation algorithm based on a state of the time-interleaved analog-to-digital converter.

17. The method of claim 12 , further comprising:
determining whether an input frequency is of a certain range; and
tuning a number of dithering levels of the time-interleaved converter in response to determining the input frequency is of the certain range.

18. A system on-chip with a time-interleaved analog-to-digital converter for assisting the time-interleaved analog-to-digital converter, the system comprising:
first circuitry for generating measurements by processing a plurality of samples of signals in the two or more analog-to-digital converters and recording the measurements in an on-chip memory accessible by a microprocessor on-chip with the time-interleaved analog-to-digital converter;
a microprocessor for executing instructions to carry out arithmetic logic for processing the measurements and calculating correction terms for calibrating the time-interleaved analog-

Assignees

• Analog Devices Inc

Inventors

• Speir Carroll C
• Otte Eric
• Rakuljic Nevena
• Bray Jeffrey Paul

Classifications

• H03M1/128 Primary

  at random intervals, e.g. digital alias free signal processing [DASP] · CPC title

• H03M1/462

  Details of the control circuitry, e.g. of the successive approximation register · CPC title

• H03M1/1028

  at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error (gain setting for range control H03M1/18) · CPC title

• H03M1/46

  with digital/analogue converter for supplying reference values to converter · CPC title

• H03M3/498

  Variable sample rate · CPC title