Background static error measurement and timing skew error measurement for RF DAC

Patent metadata

Field	Value
Publication number	US-10965302-B1
Application number	US-201916709899-A
Country	US
Kind code	B1
Filing date	Dec 10, 2019
Priority date	Oct 12, 2019
Publication date	Mar 30, 2021
Grant date	Mar 30, 2021

Abstract

Digital to analog conversion generates an analog output corresponding to a digital input by controlling unit elements or cells using data bits of the digital input. The unit elements or cells individually make a contribution to the analog output. Due to process, voltage, and temperature variations, the unit elements or cells may have mismatches. The mismatches can degrade the quality of the analog output. To extract the mismatches, a transparent dither can be used. The mismatches can be extracted by observing the analog output, and performing a cross-correlation of the observed output with the dither. Once extracted, the unit elements or cells can be adjusted accordingly to reduce the mismatches.

First claim

What is claimed is:

1. A method for extracting errors of a digital to analog converter (DAC) having a decoder and a plurality of DAC cells driven by outputs of the decoder, the method comprising:
receiving, by the decoder, a digital input having a first dither signal added thereto;
driving a first DAC cell by the first dither signal with opposite polarity;
generating a first digital output by digitizing a first analog output of the DAC resulting from the first dither signal with opposite polarity driving the first DAC cell;
cross-correlating the first digital output and the first dither signal; and
extracting one or more of: a first static error and a first timing skew error of the first DAC cell based on the cross-correlation of the first digital output and the first dither signal.

2. The method of claim 1 , further comprising:
adding, by the decoder, the first dither signal to the digital input digitally.

3. The method of claim 1 , wherein extracting the one or more of: the first static error and the first timing skew error, comprises:
deriving the first timing skew error based on a value of a first tap of the cross-correlation of the first digital output and the first dither signal.

4. The method of claim 1 , wherein extracting the one or more of: the first static error and the first timing skew error, comprises:
deriving the first static error based on a value of a zeroth tap and a value of a first tap of the cross-correlation of the first digital output and the first dither signal.

5. The method of claim 1 , further comprising:
receiving, by the decoder, the digital input having the first dither signal with opposite polarity added thereto;
driving the first DAC cell by the first dither signal;
generating a first complementary digital output by digitizing a first complementary analog output of the DAC resulting from the first dither signal driving the first DAC cell;
cross-correlating the first complementary digital output and the first dither signal with opposite polarity; and
summing the cross-correlation of the first digital output and the first dither signal and cross-correlation of the first complementary digital output and the first dither signal with opposite polarity.

6. The method of claim 5 , wherein extracting one or more of the first static error and the first timing skew error, comprises:
extracting one or more of: the first static error and the first timing skew error of the first DAC cell based on a value of a zeroth tap and a value of a first tap of summed cross-correlation results.

7. The method of claim 6 , wherein extracting one or more of the first static error and the first timing skew error, comprises:
extracting one or more of: the first static error and the first timing skew error of the first DAC cell based on half of a value of a zeroth tap and half of a value of a first tap of summed cross-correlation results.

8. The method of claim 1 , further comprising:
receiving, by the decoder, the digital input having a second dither signal added thereto;
driving a second DAC cell by the second dither signal with opposite polarity;
generating a second digital output by digitizing a second analog output of the DAC resulting from the second dither signal with opposite polarity driving the second DAC cell;
cross-correlating the second digital output and the second dither signal; and
extracting one or more of: a second static error and a second timing skew error of the second DAC cell based on the cross-correlation of the second digital output and the second dither signal.

9. The method of claim 1 , further comprising:
adding the first dither signal to an analog input signal of an analog to digital converter; and
generating, by the analog to digital converter, the digital input having the first dither signal added thereto.

10. A digital to analog converter (DAC) with error measurement, the digital to analog converter comprising:
a decoder to receive a digital input and a dither signal added thereto;
a plurality of DAC cells, comprising:
a first DAC cell to receive the dither signal with opposite polarity; and
further DAC cells driven by data bits corresponding to the digital input and the dither signal added thereto; and

an observer analog to digital converter (ADC) to quantize an analog output of the DAC cells resulting from the dither signal with opposite polarity driving the first DAC cell, and to generate a digital output.

11. The DAC of claim 10 , further comprising:
digital processing circuitry to cross-correlate the digital output and the dither signal, and to extract a static error and a timing skew error of the first DAC cell based on the cross-correlation of the digital output and the dither signal.

12. The DAC of claim 10 , wherein the decoder comprises:
a binary to thermometer decoder to convert the digital input and the dither signal added thereto into the data bits.

13. The DAC of claim 10 , wherein the decoder comprises:
an adder to add the dither signal to the digital input.

14. The DAC of claim 10 , wherein the decoder comprises:
a first multiplexer to output one of: a first bit of the data bits, and the dither signal with opposite polarity; and
a second multiplexer to output one of: a second bit of the data bits, and the dither signal with opposite polarity.

15. The DAC of claim 10 , wherein the decoder comprises:
a third multiplexer to output one of: the data bits, and the dither signal with opposite polarity.

16. The DAC of claim 10 , wherein the observer ADC is a voltage-controlled-oscillator analog to digital converter.

17. The DAC of claim 10 , wherein the first DAC cell has a different weight than the dither signal.

18. The DAC of claim 10 , further comprising:
a dither DAC cell to receive the dither signal;
a summation node to add the dither signal to an analog input of an analog to digital converter; and
the analog to digital converter to generate the digital input having the dither signal added thereto.

19. The DAC of claim 10 , wherein the first DAC cell has a same weight as the dither signal.

20. The DAC of claim 10 , wherein the DAC is a stand-alone DAC.

21. The DAC of claim 10 , wherein the DAC generates an analog signal as part of an analog to digital conversion.

22. A method for extracting errors of a digital to analog converter (DAC), comprising:
adding a dither signal to the DAC;
cancelling, by a DAC cell in the DAC, the dither signal injected to the DAC;
quantizing an output of the DAC and generating a first digital output; and
cross-correlating the dither signal with the first digital output
extracting one or more of: a static error and a timing skew error of the DAC cell from the cross-correlation.

23. The method of claim 22 , wherein extracting one or more of the static error and the timing skew error, comprises:
obtaining the static error and the timing skew error from a value of a zeroth tap and a value of a first tap of the cross-correlation.

24. The method of claim 22 , further comprising:
adding the dither signal with opposite polarity to the DAC;
cancelling, by the DAC cell in the DAC, the dither signal with opposite polarity injected to the DAC;
quantizing the output of the DAC and generating a second digital output; and
extracting the static error and the timing skew error of the DAC cell from the first digital output and the second digital output.

25. The method of clai

Assignees

• Analog Devices International Unlimited Co

Inventors

• Zhao Jialin
• Shibata Hajime
• Engel Gil

Classifications

• H03M1/10 Primary

  Calibration or testing · CPC title

• H03M7/165

  Conversion to or from thermometric code · CPC title

• H03M1/742

  using current sources as quantisation value generators · CPC title

• H03M1/1071 Primary

  Measuring or testing · CPC title

• H03M1/1033

  over the full range of the converter, e.g. for correcting differential non-linearity · CPC title