Metallic-magnetic-domain-wall-based nonvolatile tunable resistor for memory and sensor applications
US-10210970-B2 · Feb 19, 2019 · US
US10892299B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10892299-B2 |
| Application number | US-201816051457-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 31, 2018 |
| Priority date | Jul 31, 2018 |
| Publication date | Jan 12, 2021 |
| Grant date | Jan 12, 2021 |
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A magnetic field controlled transistor circuit includes a first electrode, a second electrode, and a channel including a magneto-resistive material. The channel is arranged between the first and second electrodes and electrically coupled to the first and second electrodes. The transistor circuit further includes a third electrode, a fourth electrode, and a control layer including an electrically conductive material. The control layer is arranged between the third and fourth electrodes and electrically coupled to the third and fourth electrodes. In addition, an insulating layer including an insulating material is provided. The insulating layer is arranged between the channel and the control layer and configured to electrically insulate the channel from the control layer. A related method for operating a transistor circuit and a corresponding design structure are also provided.
Opening claim text (preview).
What is claimed is: 1. A magnetic field controlled transistor circuit, comprising: a first electrode; a second electrode; a channel comprising a magneto-resistive material, the channel being arranged between the first and the second electrode and electrically coupled to the first and the second electrode; a third electrode; a fourth electrode; a control layer comprising an electrically conductive material, the control layer being arranged between the third and the fourth electrode and electrically coupled to the third and the fourth electrode; and an insulating layer comprising an insulating material, the insulating layer being arranged between the channel and the control layer and being configured to electrically insulate the channel from the control layer; wherein the magneto-resistive material is a colossal magneto-resistive material. 2. The transistor circuit according to claim 1 , wherein the colossal magneto-resistive material is a colossal manganite of the chemical formula: RE 1-X AE X MnO 3 , wherein RE is selected from the group consisting of La, Pr and Sm and AE is selected from the group consisting of Ca, Sr, Ba and Pb. 3. The transistor circuit according to claim 1 , further comprising: a control circuit configured to control the resistivity of the channel by driving a control current between the third and fourth electrode through the control layer, wherein the control current induces a controllable magnetic field in the channel. 4. The transistor circuit according to claim 3 , wherein the control circuit comprises a controllable current source or a controllable voltage source configured to drive the control current through the control layer. 5. The transistor circuit according to claim 1 , wherein the channel and the control layer are arranged in parallel to each other. 6. A logic circuit comprising: a plurality of magnetic field controlled transistor circuits, each of the transistor circuits in turn comprising: a first electrode; a second electrode; a channel comprising a magneto-resistive material, the channel being arranged between the first and the second electrode and electrically coupled to the first and the second electrode; a third electrode; a fourth electrode; a control layer comprising an electrically conductive material, the control layer being arranged between the third and the fourth electrode and electrically coupled to the third and the fourth electrode; and an insulating layer comprising an insulating material, the insulating layer being arranged between the channel and the control layer and being configured to electrically insulate the channel from the control layer; wherein the magneto-resistive material is a colossal magneto-resistive material. 7. The logic circuit according to claim 6 , wherein the logic circuit is configured to operate with a supply voltage of less than 0.4 V. 8. A high frequency amplifier comprising one or more magnetic field controlled transistor circuits, each of said one or more transistor circuits in turn comprising: a first electrode; a second electrode; a channel comprising a magneto-resistive material, the channel being arranged between the first and the second electrode and electrically coupled to the first and the second electrode; a third electrode; a fourth electrode; a control layer comprising an electrically conductive material, the control layer being arranged between the third and the fourth electrode and electrically coupled to the third and the fourth electrode; and an insulating layer comprising an insulating material, the insulating layer being arranged between the channel and the control layer and being configured to electrically insulate the channel from the control layer; wherein the magneto-resistive material is a colossal magneto-resistive material. 9. The high frequency amplifier according to claim 8 , wherein the one or more transistor circuits are configured to operate at a frequency of more than 1 THz. 10. A method for operating a magneto-resistive material, the channel being arranged between the first and the second electrode; a third electrode; a fourth electrode; a control layer comprising an electrically conductive material, the control layer being arranged between the third and the fourth electrode; and an insulating layer comprising an insulating material, the insulating layer being arranged between the channel comprising the magneto-resistive material and the control layer; wherein the magneto-resistive material is a colossal magneto-resistive material; the method comprising: driving a control current between the third and the fourth electrode through the control layer, thereby applying a magnetic field on the channel and controlling the resistivity of the channel by the magnetic field being induced by the control current. 11. The method according to claim 10 , further comprising: applying a control voltage to the third and the fourth electrode to drive the control current. 12. The method according to claim 11 , further comprising: increasing the control voltage in order to increase the resistance of the channel; and decreasing the control voltage in order to decrease the resistance of the channel. 13. A design structure tangibly embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, the design structure comprising: a magnetic field controlled transistor circuit, comprising: a first electrode; a second electrode; a channel comprising a magneto-resistive material, the channel being arranged between the first and the second electrode and electrically coupled to the first and the second electrode; a third electrode; a fourth electrode; a control layer comprising an electrically conductive material, the control layer being arranged between the third and the fourth electrode and electrically coupled to the third and the fourth electrode; and an insulating layer comprising an insulating material, the insulating layer being arranged between the channel and the control layer and being configured to electrically insulate the channel from the control layer; wherein the magneto-resistive material is a colossal magneto-resistive material. 14. The design structure according to claim 13 , further comprising: a control circuit configured to control the resistivity of the channel by driving a control current between the third first and fourth electrode through the control layer, wherein the control current induces a controllable magnetic field in the channel. 15. The design structure according to claim 13 , wherein the control circuit comprises a controllable current source or controllable voltage source configured to drive the control current through the control layer.
Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00 (MRAM devices H10B61/00) · CPC title
Materials of the active region · CPC title
Amplifiers using galvano-magnetic effects not involving mechanical movement, e.g. using Hall effect · CPC title
using galvano-magnetic devices, e.g. Hall-effect devices · CPC title
Electricity · mapped topic
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