Method of forming titanium oxide film and method of forming hard mask

Patent metadata

Field	Value
Publication number	US-10535528-B2
Application number	US-201715730127-A
Country	US
Kind code	B2
Filing date	Oct 11, 2017
Priority date	Oct 13, 2016
Publication date	Jan 14, 2020
Grant date	Jan 14, 2020

Abstract

A method for forming a titanium oxide film on a substrate to be processed, which has a silicon portion on a surface thereof, the method including: forming a first titanium oxide film on the surface of the substrate to be processed, which includes the silicon portion, by means of thermal ALD by alternately supplying a titanium-containing gas and a gas containing hydrogen and oxygen serving as an oxidizing agent in a first stage; and forming a second titanium oxide film on the first titanium oxide film by means of plasma ALD by alternately supplying a titanium-containing gas and plasma of an oxygen-containing gas as an oxidizing agent in a second stage.

First claim

What is claimed is:

1. A method of forming a titanium oxide film on a substrate to be processed, which has a silicon portion on a surface thereof, the method comprising:
forming a first titanium oxide film on the surface of the substrate to be processed, which includes the silicon portion, by means of thermal ALD by alternately supplying a titanium-containing gas and a gas containing hydrogen and oxygen serving as an oxidizing agent in a first stage; and
forming a second titanium oxide film on the first titanium oxide film by means of plasma ALD by alternately supplying a titanium-containing gas and plasma of an oxygen-containing gas as an oxidizing agent in a second stage.

2. The method according to claim 1 , wherein the forming a first titanium oxide film in the first stage is performed so as to suppress surface oxidation of the silicon portion so that the first titanium oxide film functions as a barrier of surface oxidation of the silicon portion when forming the second titanium oxide film in the second stage.

3. The method according to claim 1 , wherein a titanium oxide film serving as a hard mask is formed.

4. The method according to claim 1 , wherein the gas containing hydrogen and oxygen, which is used as the oxidizing agent when forming the first titanium oxide film in the first stage, is an H 2 O gas.

5. The method according to claim 1 , wherein the plasma of the oxygen-containing gas, which is used as the oxidizing agent when forming the second titanium oxide film in the second stage, is plasma of an O 2 gas.

6. The method according to claim 1 , wherein forming a first titanium oxide film in the first stage and forming a second titanium oxide film in the second stage are performed in the same chamber.

7. A method of forming a hard mask for pattern-etching an etching target film in a substrate to be processed that has a silicon portion in a predetermined pattern and has the etching target film on a surface of the substrate to be processed, the method comprising:
forming a first titanium oxide film on the surface of the substrate to be processed, which includes the silicon portion, by means of thermal ALD by alternately supplying a titanium-containing gas and a gas containing hydrogen and oxygen serving as an oxidizing agent in a first stage;
forming a second titanium oxide film on the first titanium oxide film by means of plasma ALD by alternately supplying a titanium-containing gas and plasma of an oxygen-containing gas as an oxidizing agent in a second stage; and
forming a hard mask in a predetermined pattern by etching a titanium oxide film including the first titanium oxide film formed in the first stage and the second titanium oxide film formed in the second stage.

8. The method according to claim 7 , wherein the silicon portion has a convex portion, and the hard mask is formed as a sidewall spacer of the convex portion in forming a hard mask.

9. The method according to claim 8 , wherein the first titanium oxide film and the second titanium oxide film are conformally deposited on the convex portion.

10. The method according to claim 7 , further comprising: removing the silicon portion by etching after forming a hard mask.

11. The method according to claim 7 , wherein the gas containing hydrogen and oxygen, which is used as the oxidizing agent when forming the first titanium oxide film in the first stage, is an H 2 O gas.

12. The method according to claim 7 , wherein the plasma of the oxygen-containing gas, which is used as the oxidizing agent when forming the second titanium oxide film in the second stage, is plasma of an O 2 gas.

13. The method according to claim 7 , wherein forming a first titanium oxide film in the first stage and forming a second titanium oxide film in the second stage are performed in the same chamber.

Assignees

• Tokyo Electron Ltd

Inventors

• Shindo Naoki
• Hasegawa Toshio
• Noro Naotaka
• Kaneko Miyako

Classifications

• H10P76/4085

  characterised by the processes involved to create the masks · CPC title

• H10P50/696

  Process specially adapted to improve the resolution of the mask · CPC title

• H10P50/692

  characterised by their composition, e.g. multilayer masks or materials · CPC title

• H10P50/73

  using masks for insulating materials · CPC title

• H10P14/69394 Primary

  the material containing titanium, e.g. TiO2 · CPC title