Method of processing substrate, method of manufacturing semiconductor device, recording medium, and substrate processing apparatus
US-2024234132-A1 · Jul 11, 2024 · US
US10519548B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10519548-B2 |
| Application number | US-201615272503-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 22, 2016 |
| Priority date | Sep 28, 2015 |
| Publication date | Dec 31, 2019 |
| Grant date | Dec 31, 2019 |
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A film forming apparatus includes: process container to generate vacuum atmosphere; mounting part to mount substrate; heating part to heat the substrate mounted on the mounting part; gas supply part installed at rear side of the substrate mounted on the mounting part and configured to supply film forming gas toward front side of the substrate along surface of the substrate and flow rate of the film forming gas becomes uniform in width direction of flow of the film forming gas; rotation mechanism to rotate the mounting part about axis orthogonal to the substrate when the film forming gas is supplied to the substrate; film thickness adjustment part to adjust film thickness distribution of film on the substrate in flow direction of the film forming gas when viewed in state where the mounting part is stopped; and exhaust port provided at the front side of the substrate.
Opening claim text (preview).
What is claimed is: 1. A film forming apparatus, comprising: a process container configured to generate a vacuum atmosphere; a mounting part provided within the process container, and configured to mount a substrate; a heating part configured to heat an opposite side from a mounting surface of the mounting part to heat the substrate mounted on the mounting part; a gas supply part installed at a rear side of the substrate mounted on the mounting part, and configured to supply a film forming gas so that the film forming gas flows toward a front side of the substrate along a surface of the substrate over the entire surface of the substrate and so that a flow rate of the film forming gas becomes uniform in a width direction of a flow of the film forming gas; a rotation mechanism configured to rotate the mounting part about an axis orthogonal to the substrate when the film forming gas is supplied to the substrate; a film thickness adjustment part configured to adjust a film thickness distribution of a film on the substrate in a flow direction of the film forming gas when viewed in a state in which the mounting part is stopped; and an exhaust port provided at the front side of the substrate, wherein the film thickness adjustment part is a concentration adjustment gas supply part provided to face the substrate and configured to supply a concentration adjustment gas to the flow of the film forming gas in order to adjust a concentration distribution of the film forming gas in the flow direction of the film forming gas, wherein the concentration adjustment gas supply part is further configured to extend in a width direction of the flow of the film forming gas, the concentration adjustment gas supply part including a plurality of gas injection ports arranged in the flow direction of the film forming gas to inject a dilution gas as the concentration adjustment gas, wherein each of the plurality of gas injection ports includes a supply path obliquely formed toward the front side of the substrate and having a slit shape extending in the width direction by a length more than a size of the substrate, and a tube-shaped buffer chamber communicating with the supply path and extending in the width direction, to assist the dilution gas to be injected at a uniform rate in the width direction, and wherein the plurality of gas injection ports is configured to inject the dilution gas at the uniform rate in the width direction and to be able to inject the dilution gas at different rates in the flow direction.
the material containing titanium, e.g. TiO2 · CPC title
deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD · CPC title
the materials being characterised by the deposition precursor materials · CPC title
characterized by the apparatus · CPC title
Use of auxiliary reactants other than used for contributing to the composition of the main film, e.g. catalysts, activators or scavengers · CPC title
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