Characterizing target material properties based on properties of similar materials

Patent metadata

Field	Value
Publication number	US-10516725-B2
Application number	US-201414497695-A
Country	US
Kind code	B2
Filing date	Sep 26, 2014
Priority date	Sep 26, 2013
Publication date	Dec 24, 2019
Grant date	Dec 24, 2019

Abstract

Roughly described, a technique for approximating a target property of a target material is provided. For each material in a plurality of anchor materials, a correspondence is provided between the value for a predetermined index property of the material and a value for the target property of the material, the values of all the index properties being different. A predictor function is identified in dependence upon the correspondence. A computer system determines a value for the target property for the target material in dependence upon the predictor function and a value for the index property for the target material. The determined value for the target property for the target material is reported to a user. The correspondence can be provided in a database on a non-transitory computer readable medium. The correspondence can be determined experimentally or analytically for each material in a plurality of anchor materials.

First claim

The invention claimed is:

1. A system for selecting candidate alloys in dependence upon their determined values for a target property relevant to building or improving integrated circuit devices,
the system comprising a memory and a data processor coupled to the memory, the data processor configured with:
a source of, for each alloy in a plurality of anchor alloys, a correspondence between a mole fraction of each element in the anchor alloy and a value for the target property of the anchor alloy, the mole fractions for all the anchor alloys being different;
a target value prediction module which is configured to:
provide a predictor function form for the target property in dependence upon physics principles of the target property in alloys, the predictor function form having a set of at least one coefficient,
determine the coefficients in dependence upon the correspondences between the mole fraction of each element in the anchor alloys and the value for the target property of the anchor alloy, and
determine a value for the target property for each of a plurality of candidate alloys in dependence upon the mole fraction of each element in the candidate alloy and in further dependence upon the predictor function, each of the candidate alloys being different from the anchor alloys; and

a choosing module to choose one or more but fewer than all of the candidate alloys for further evaluation as an alloy for building or improving integrated circuit devices, based on their determined values for the target property.

2. The system of claim 1 , wherein the source of the correspondence comprises a database on a non-transitory computer readable medium.

3. The system of claim 2 , wherein correspondences were determined experimentally for each alloy in the plurality of anchor alloys.

4. The system of claim 1 , wherein the source of correspondences comprises an analysis module of a computer system, the analysis module determining the value for the target property of a given anchor alloy in dependence upon a description of the given anchor alloy provided to the analysis module.

5. The system of claim 4 , wherein the provided description of the given anchor alloy comprises a lattice cell description for the given anchor alloy.

6. The system of claim 4 , wherein the provided description of the given anchor alloy comprises descriptions of a plurality of lattice cell configurations that the given anchor alloy can assume, each in association with its relative probability of occurrence.

7. The system of claim 6 , wherein the analysis module:
calculates a value for the target property for each of the lattice cell configurations; and
provides as the value for the target property of the anchor alloy an average of the values calculated for each of the lattice cell configurations, weighted by their relative probabilities of occurrence.

8. The system of claim 4 , wherein the analysis module comprises a first principles analysis module.

9. The system of claim 4 , wherein the analysis module comprises a density functional theory analysis module.

10. The system of claim 1 , wherein determining the coefficients of the predictor function comprises fitting the form of the predictor function to the values in the correspondences to determine values for the coefficients.

11. The system of claim 10 , wherein the form of the predictor function is a polynomial.

12. A method for selecting candidate alloys in dependence upon their determined values for a target property relevant to building or improving integrated circuit devices, comprising:
for each alloy in a plurality of anchor alloys, a computer system providing a correspondence between a mole fraction of each element in the anchor alloy and a value for a target property of the anchor alloy, the mole fractions for all the anchor alloys being different;
a computer system providing a predictor function form for the target property in dependence upon physics principles of the target property in alloys, the predictor function form having a set of at least one coefficient;
a computer system determining the coefficients in dependence upon the correspondences between the mole fraction of each element in the anchor alloys and the value for the target property of the anchor alloy;
a computer system determining a value for the target property for each of a plurality of candidate alloys in dependence upon the mole fraction of each element in the candidate alloy and in further dependence upon the predictor function, each of the candidate alloys being different from the anchor alloys; and
choosing one or more but fewer than all the candidate alloys for further evaluation as an alloy for building or improving integrated circuit devices, based on their determined values for the target property.

13. The method of claim 12 , wherein providing a correspondence comprises providing the correspondence in a database on a non-transitory computer readable medium.

14. The method of claim 12 , wherein providing a correspondence comprises determining the correspondences experimentally for each alloy in a plurality of anchor alloys.

15. The method of claim 12 , wherein providing a correspondence comprises, for a given one of the anchor alloys:
providing a description of the given anchor alloy to an analysis module of a computer system; and
executing the analysis module to determine the value for the target property of given alloy, in dependence upon the description.

16. The method of claim 15 , wherein providing a description of the given anchor alloy comprises identifying to the analysis module a lattice cell description for the given anchor alloy.

17. The method of claim 15 , wherein providing a description of the given anchor alloy comprises identifying to the analysis module descriptions of a plurality of lattice cell configurations that the given anchor alloy can assume, each in association with its relative probability of occurrence.

18. The method of claim 17 , further comprising the analysis module:
calculating a value for the target property for each of the lattice cell configurations; and
providing as the value for the target property of the alloy an average of the values calculated for each of the lattice cell configurations, weighted by their relative probabilities of occurrence.

19. The method of claim 15 , wherein the analysis module comprises a first principles analysis module.

20. The method of claim 15 , wherein the analysis module comprises a density functional theory analysis module.

21. The method of claim 12 , wherein determining the coefficients of the predictor function form comprises fitting the form of the predictor function to the values in the correspondences to determine values for the coefficients.

22. The method of claim 21 , wherein the form of the predictor function is a polynomial.

23. The method of claim 12 , wherein determining a value for the target property for a given one of the candidate alloys comprises evaluating the predictor function using the mole fraction of each element in the given candidate alloy.

24. A system for selecting candidate alloys in dependence upon their determined values for a target property relevant to building or improving integrated circuit devices,
the system comprising a memory and a data processor coupled to the memory, the data processor configured with:
a source of, for each alloy in a plurality of anchor alloys, a correspondence between a mole fraction of each elem

Assignees

• Synopsys Inc

Inventors

• Moroz Victor
• Smith Stephen Lee
• Oh Yong-Seog
• Liu Jie
• Shaughnessy-Culver Michael C
• Ma Terry Sylvan Kam-Chiu

Classifications

• G06F30/30 Primary

  Circuit design · CPC title

• H04L67/10 Primary

  in which an application is distributed across nodes in the network (software deployment G06F8/60; multiprogramming arrangements G06F9/46) · CPC title

• G06F17/5045

  Physics · mapped topic