Fixing mechanism actuatable without a tool and which fixes a measuring probe in a detachable manner for a scanning probe microscope

Patent metadata

Field	Value
Publication number	US-10386386-B2
Application number	US-201615240148-A
Country	US
Kind code	B2
Filing date	Aug 18, 2016
Priority date	Aug 19, 2015
Publication date	Aug 20, 2019
Grant date	Aug 20, 2019

Abstract

A fixing device selectively fixes a measuring probe of a scanning probe microscope. The fixing device comprises an inserting unit in which the measuring probe is insertable and a master force unit for selectively exerting a master force onto a fixing mechanism. The fixing mechanism is actuatable without a tool. The fixing mechanism is enabled or disabled to controllably detach or fix the measuring probe when the measuring probe is inserted in the inserting unit.

First claim

The invention claimed is:

1. A device for selectively fixing a measuring probe of a scanning probe microscope which comprises:
an inserting unit, in which the measuring probe is insertable,
wherein the inserting unit comprises an accommodation slot, in which the measuring probe can be accommodated, and
wherein the mere measuring probe without being attached to an auxiliary body is insertable into the accommodation slot of the inserting unit; and
a master force unit for selectively exerting a master force on a fixing mechanism which is actuatable without a tool,
wherein the fixing mechanism is responsive to the master force unit for detaching and/or fixing the measuring probe by controlling an interactive force when the measuring probe is inserted in the inserting unit,
wherein the fixing mechanism is configured such that, when the master force is disabled, the measuring probe is fixed to the inserting unit, and when the master force is enabled, the measuring probe is detached from the inserting unit, and
wherein the master force unit is selected from the group consisting of a master force unit for exerting a magnetic master force, an electrical master force, a thermal master force.

2. The device according to claim 1 , wherein the master force unit is configured for controlling the detaching and/or the fixing by exerting an adjustable master force.

3. The device according to claim 1 , wherein the inserting unit comprises a holding force enhancement element with a curved adhesion force transmission surface which, in a state of the measuring probe inserted in the inserting unit, directly acts upon the measuring probe.

4. The device according to claim 1 , wherein the fixing mechanism comprises at least two magnetic elements whose magnetic interacting force is configured for clampingly fixing the measuring probe.

5. The device according to claim 4 , wherein the at least two magnetic elements are configured to repel each other due to their magnetic interacting force and to act upon the measuring probe, which is inserted in the inserting unit, such that the measuring probe is clampingly fixed in the inserting unit.

6. The device according to claim 5 , comprising at least one of the following features:
wherein the at least two magnetic elements are arranged in and/or at the same of two opposing fixing bodies of the fixing device, between which the measuring probe is arranged in the state inserted in the inserting unit;
wherein each of the two magnetic elements are arranged in and/or at respective opposed fixing bodies of the fixing device, between which the measuring probe is arranged in the state inserted in the inserting unit, and the clampingly fixing of the measuring probe in the inserting unit is performable by a rotating lever mechanism.

7. The device according to claim 4 , wherein the at least two magnetic elements are configured to attract each other due to their magnetic interacting force and to act upon the measuring probe, which is inserted in the inserting unit, such that the measuring probe is clampingly fixed in the inserting unit.

8. The device according to claim 7 , wherein each of the two magnetic elements is arranged in and/or at another of two opposing fixing bodies of the fixing device, between which the measuring probe is arranged in the state inserted in the inserting unit.

9. The device according to claim 4 , comprising at least one of the following features:
wherein one of the magnetic elements is movably mounted and the other one of the magnetic elements is immovably mounted in and/or at the fixing device;
wherein one of the magnetic elements forms a part of a magnetic circuit with an air path and the other one of the magnetic elements is movably arranged in the air path and is pulled out of it under the influence of a magnetic force.

10. The device according to claim 1 , wherein the fixing mechanism comprises an element which is curved in the absence of a master force generated by the master force unit, which element is configured, when the master force is acting, to become at least partially uncurved and thereby, under formation of a clamping fixing of the measuring probe, to extend up to an accommodation cavity of the measuring probe in the inserting unit.

11. The device according to claim 10 , comprising at least one of the following features:
wherein the curved element comprises a magnetic material, which, when a magnetic master force which is generated by the master force unit is acting, becomes at least partially uncurved;
wherein the curved element comprises a material with shape memory, which, when a thermal master force which is generated by the master force unit is acting, becomes at least partially uncurved.

12. The device according to claim 1 , wherein the fixing mechanism comprises a magnetic element and a non-magnetic bias element which biases the magnetic element in an accommodation cavity of the measuring probe in the inserting unit, wherein the magnetic element is guidable out of the accommodation cavity by a magnetic master force generated by the master force unit.

13. The device according to claim 12 , wherein the non-magnetic bias element is selected from the group consisting of a mechanical spring, a hydraulic bias element and a pneumatic bias element.

14. A scanning probe microscope for determining a surface information with respect to a sample body by scanningly sensing a surface of the sample body which comprises:
a measuring probe which is adapted for scanningly sensing the surface of the sample body; and
a fixing device for selectively fixing the measuring probe, wherein the fixing device comprises:
an inserting unit, in which the measuring probe is insertable,
wherein the inserting unit comprises an accommodation slot, in which the measuring probe can be accommodated, and
wherein the mere measuring probe without being attached to an auxiliary body is insertable into the accommodation slot of the inserting unit; and
a master force unit for selectively exerting a master force on a fixing mechanism which is actuatable without a tool, wherein the fixing mechanism is responsive to the master force unit for detaching and/or fixing the measuring probe by controlling an interactive force when the measuring probe is inserted in the inserting unit,
wherein the fixing mechanism is configured such that, when the master force is disabled, the measuring probe is fixed to the inserting unit, and when the master force is enabled, the measuring probe is detached from the inserting unit, and
wherein the master force unit is selected from the group consisting of a master force unit for exerting a magnetic master force, an electrical master force, a thermal master force.

15. The scanning probe microscope according to claim 14 , configured as a scanning force microscope.

16. The scanning probe microscope according to claim 14 , wherein the measuring probe comprises:
a probe body for fixing by the fixing device; and
a measuring tip which includes a carbon nanotube, for sensing the surface.

17. The scanning probe microscope according to claim 16 , comprising at least one of the following features:
wherein a surface of the probe body which is facing the measuring tip is electrically conductive and, in a state fixed to the fixing device, electrically conductively coupled to an electrical measuring unit of the scanning probe microscope for capturing an information indicative for the electrical properties of the sample body;
wherein the probe body comprises an electric circuit;
wherein the probe body comprises a reflection coating

Assignees

• Anton Paar Gmbh

Inventors

• Gomez-Casado Alberto
• Rath Norbert

Classifications

• G01Q70/02 Primary

  Probe holders · CPC title

• G01Q70/18

  Functionalisation · CPC title

• G01Q70/06

  Probe tip arrays · CPC title

• G01Q60/16 Primary

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title