Probe chip, scan head, scanning probe microscopy device and use of a probe chip
US-12117467-B2 · Oct 15, 2024 · US
Probe holders
Probe holders · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q70/02 |
| Official title | Probe holders |
| Display label | Probe holders |
| Total patents | 58 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 5 |
| 2016 | 1 |
| 2017 | 5 |
| 2018 | 9 |
| 2019 | 10 |
| 2020 | 11 |
| 2021 | 7 |
| 2022 | 3 |
| 2023 | 6 |
| 2024 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Sensor probe assembly
US-11841330-B2 · Dec 12, 2023 · US
Metrology probe with built-in angle and method of fabrication thereof
US-11719719-B2 · Aug 8, 2023 · US
Probe cassette for holding a probe in storage for use in a scanning probe microscope
US-11709181-B2 · Jul 25, 2023 · US
Probe, method of manufacturing a probe and scanning probe microscopy system
US-11698389-B2 · Jul 11, 2023 · US
Probe, method of manufacturing a probe and scanning probe microscopy system
US-2023160924-A1 · May 25, 2023 · US
Method of positioning a carrier on a flat surface, and assembly of a carrier and a positioning member
US-11650224-B2 · May 16, 2023 · US
Metrology Probe with Built-In Angle and Method of Fabrication Thereof
US-2022404392-A1 · Dec 22, 2022 · US
Probe cassette for holding a probe in storage for use in a scanning probe microscope
US-2022390486-A1 · Dec 8, 2022 · US
Surface analysis device
US-11499989-B2 · Nov 15, 2022 · US
Surface analysis device
US-2021349125-A1 · Nov 11, 2021 · US
Probe chip, scan head, scanning probe microscopy device and use of a probe chip
US-2021278436-A1 · Sep 9, 2021 · US
Sensor probe assembly
US-2021231578-A1 · Jul 29, 2021 · US
Z-position motion stage for use in a scanning probe microscopy system, scan head and method of manufacturing
US-11035879-B2 · Jun 15, 2021 · US
Handling device for handling a measuring probe
US-11022786-B2 · Jun 1, 2021 · US
Device and method for measuring and/or modifying surface features on a surface of a sample
US-10908179-B2 · Feb 2, 2021 · US
Nozzle inspection method and apparatus
US-10890427-B2 · Jan 12, 2021 · US
Handling Device for Handling a Measuring Probe
US-2020326518-A1 · Oct 15, 2020 · US
Scanning probe microscope
US-10802044-B2 · Oct 13, 2020 · US
Probe assembly and testing device
US-10782314-B2 · Sep 22, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q70/02?
- CPC G01Q70/02 is the Cooperative Patent Classification code for “Probe holders.”
- How many patents are filed under CPC G01Q70/02 (Probe holders)?
- Our database includes 58 publications tagged with this CPC code.
- Is patent activity under CPC G01Q70/02 growing?
- Publication counts under this code: 6 in 2023 vs 1 in 2024 (latest complete years).