Defect detection using thermal laser stimulation and atomic force microscopy
US-2024069095-A1 · Feb 29, 2024 · US
Probe tip arrays
Probe tip arrays · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q70/06 |
| Official title | Probe tip arrays |
| Display label | Probe tip arrays |
| Total patents | 115 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 13 |
| 2017 | 5 |
| 2018 | 10 |
| 2019 | 9 |
| 2020 | 11 |
| 2021 | 20 |
| 2022 | 15 |
| 2023 | 6 |
| 2024 | 15 |
| 2025 | 4 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Array atomic force microscopy for enabling simultaneous multi-point and multi-modal nanoscale analyses and stimulations
US-2021396783-A1 · Dec 23, 2021 · US
Micro probe array device and manufacturing method of the device
US-2021311092-A1 · Oct 7, 2021 · US
Probe chip, scan head, scanning probe microscopy device and use of a probe chip
US-2021278436-A1 · Sep 9, 2021 · US
Method of positioning probe tips relative to pads
US-10996239-B1 · May 4, 2021 · US
Atomic force microscopy tips for interconnection
US-2021055327-A1 · Feb 25, 2021 · US
Apparatus and methods for non-destructive inspection using microwave microscopy
US-10823757-B2 · Nov 3, 2020 · US
Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system
US-2020309816-A1 · Oct 1, 2020 · US
Method for Producing a Probe Suitable for Scanning Probe Microscopy
US-2020278379-A1 · Sep 3, 2020 · US
Numerically controlled rotary probe switching device based on environment-controllable atomic force microscope
US-10739377-B2 · Aug 11, 2020 · US
Alignment system and method
US-10663874-B2 · May 26, 2020 · US
Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes
US-10649003-B2 · May 12, 2020 · US
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-2020141972-A1 · May 7, 2020 · US
Numerically Controlled Rotary Probe Switching Device Based on Environment-Controllable Atomic Force Microscope
US-2020096539-A1 · Mar 26, 2020 · US
Method of and atomic force microscopy system for performing subsurface imaging
US-2020057028-A1 · Feb 20, 2020 · US
Apparatus and method for a scanning probe microscope
US-2020025796-A1 · Jan 23, 2020 · US
Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
US-10527645-B2 · Jan 7, 2020 · US
Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
US-2019317126-A1 · Oct 17, 2019 · US
Fixing mechanism actuatable without a tool and which fixes a measuring probe in a detachable manner for a scanning probe microscope
US-10386386-B2 · Aug 20, 2019 · US
Alignment system and method
US-2019250524-A1 · Aug 15, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q70/06?
- CPC G01Q70/06 is the Cooperative Patent Classification code for “Probe tip arrays.”
- How many patents are filed under CPC G01Q70/06 (Probe tip arrays)?
- Our database includes 115 publications tagged with this CPC code.
- Is patent activity under CPC G01Q70/06 growing?
- Publication counts under this code: 15 in 2024 vs 4 in 2025 (latest complete years).