Process for forming a film on a substrate using multi-port injection assemblies

US10262859B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10262859-B2
Application numberUS-201815863340-A
CountryUS
Kind codeB2
Filing dateJan 5, 2018
Priority dateMar 24, 2016
Publication dateApr 16, 2019
Grant dateApr 16, 2019

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Abstract

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A gas distribution system is disclosed in order to obtain better film uniformity on a substrate in a cross-flow reactor. The better film uniformity may be achieved by an asymmetric bias on individual injection ports of the gas distribution system. The gas distribution may allow for varied tunability of the film properties.

First claim

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What is claimed is: 1. A process for forming a film on a substrate, comprising: providing a reaction chamber, the reaction chamber holding a substrate to be processed; providing a first multiple port injector assembly, the first multiple port injector assembly comprising a first plurality of individual port injectors for providing a first gas from a first gas source to the substrate; providing a second multiple port injector assembly, the second multiple port injector assembly comprising a second plurality of individual port injectors for providing a second gas from a second gas source to the substrate; flowing the first gas onto the substrate with the first multiple port injector assembly; and flowing the second gas onto the substrate with the second multiple port injector assembly, wherein one or more of: the first multiple port injector assembly has an asymmetric bias of the first plurality of individual port injectors, and the second multiple port injector assembly has an asymmetric bias of the second plurality of individual port injectors; wherein a substantially uniform distribution of the first gas and the second gas across the substrate is achieved; and wherein a reaction takes place between the first gas and the second gas on the substrate to form a first film. 2. The process of claim 1 , wherein the first gas comprises at least one of: dichlorosilane (DCS); silane (SiH 4 ); disilane (Si 2 H 6 ); trisilane (Si 3 H 8 ); trichlorosilane (TCS); hydrochloric acid (HCl); hydrogen (H 2 ); or nitrogen (N 2 ). 3. The process of claim 1 , wherein the second gas comprises at least one of: phosphine (PH 3 ); germane (GeH 4 ); digermane (Ge 2 H 6 ); diborane (B 2 H 6 ); CH 4 ; mono-methylsilane (MMS); tin chloride (SnCl 4 ); tin hydride; hydrochloric acid (HCl); chlorine (Cl 2 ); hydrogen (H 2 ); or nitrogen (N 2 ). 4. The process of claim 1 , wherein the reaction chamber performs a selective process on the substrate. 5. The process of claim 4 , wherein the selective process comprises a cyclic deposition and etching (CDE) process. 6. The process of claim 4 , wherein the selective process comprises a co-flow of the first gas and the second gas. 7. The process of claim 4 , wherein the selective process comprises a selective epitaxial growth (SEG) process. 8. The process of claim 1 , wherein the reaction chamber performs a non-selective process on the substrate. 9. The process of claim 1 , wherein a pressure of the reaction chamber ranges between 1 torr and 760 torr, or between 500 torr and 760 torr. 10. The process of claim 1 , wherein a temperature of the reaction chamber ranges between 100° C. and 800° C., or between 150° C. and 500° C. 11. The process of claim 1 , wherein the first multiple port injector assembly has an asymmetric bias of the first plurality of individual port injectors and the asymmetric bias of the first plurality of individual port injectors comprises a first number of individual port injectors flowing the first gas and a second number of individual port injectors not flowing the first gas. 12. The process of claim 1 , wherein the second multiple port injector assembly has an asymmetric bias of the second plurality of individual port injectors and the asymmetric bias of the second plurality of individual port injectors comprises a third number of individual port injectors flowing the second gas and a fourth number of individual port injectors not flowing the second gas. 13. A process for forming a film on a substrate, comprising: providing a reaction chamber, the reaction chamber holding a substrate to be processed; providing a first multiple port injector assembly, the first multiple port injector assembly comprising a first plurality of individual port injectors for providing a first gas from a first gas source to the substrate; providing a second multiple port injector assembly, the second multiple port injector assembly comprising a second plurality of individual port injectors for providing a second gas from a second gas source to the substrate; flowing the first gas onto the substrate with the first multiple port injector assembly, wherein the first multiple port injector assembly has an asymmetric bias of the first plurality of individual port injectors; and flowing the second gas onto the substrate with the second multiple port injector assembly, wherein the second multiple port injector assembly has an asymmetric bias of the second plurality of individual port injectors; wherein a substantially uniform distribution of the first gas and the second gas across the substrate is achieved; and wherein a reaction takes place between the first gas and the second gas on the substrate to form the film. 14. The process of claim 13 , wherein the asymmetric bias of the first plurality of individual port injectors comprises a first number of individual port injectors flowing the first gas and a second number of individual port injectors not flowing the first gas.

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What does patent US10262859B2 cover?
A gas distribution system is disclosed in order to obtain better film uniformity on a substrate in a cross-flow reactor. The better film uniformity may be achieved by an asymmetric bias on individual injection ports of the gas distribution system. The gas distribution may allow for varied tunability of the film properties.
Who is the assignee on this patent?
Asm Ip Holding Bv
What technology area does this patent fall under?
Primary CPC classification H10P14/27. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 16 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).