Measuring device and a method for measuring a high-frequency signal with deembedding

Patent metadata

Field	Value
Publication number	US-10168411-B2
Application number	US-201415031676-A
Country	US
Kind code	B2
Filing date	Oct 13, 2014
Priority date	Oct 22, 2013
Publication date	Jan 1, 2019
Grant date	Jan 1, 2019

Abstract

The invention relates to a measuring device for measuring a high-frequency signal and a method for correcting a high-frequency signal superposed with measurement errors by means of the measuring device. The measurement is a time-domain measurement in real-time. The measuring device provides a measurement-signal input, an analog digital converter and a processing unit, wherein the measurement-signal input is connected to a device under test in order to measure the high-frequency signal. According to the invention a deembedding unit is arranged in the signal path of the measuring device between analog-digital converter and the processing unit in order to compensate measurement errors resulting from the connection of devices under test and measuring devices.

First claim

The invention claimed is:

1. A measurement apparatus for measuring a high-frequency signal, wherein the measurement comprises a time-domain measurement in real-time, the measurement apparatus comprising:
an analog input configured to interface with a device under test (DUT) and to receive the high-frequency signal from the DUT;
an analog-to-digital converter (ADC) configured to digitize the high-frequency signal;
a signal processor; and
a signal deembedding circuit, disposed in a signal path between the ADC and the signal processor; and
wherein the signal deembedding circuit is configured to receive predetermined S-parameters associated with the DUT to in order to configure the signal deembedding circuit for the DUT based on the predetermined S-parameters,
wherein the signal deembedding circuit is configured to generate a compensated signal by compensating for signal effects in the high-frequency signal resulting from the interface between the analog input and the DUT, wherein the signal effects include echoes due to error matchings of the interface, wherein the signal deembedding circuit comprises at least one echo-compensation filter configured to compensate for the echoes, wherein the signal deembedding circuit facilitates a correction calculation on the digital plane in order to correct measurement errors which are superposed on the high-frequency signal to be measured, and
wherein the signal processor is configured to receive and further process the compensated signal for the time-domain measurement.

2. The measurement apparatus according to claim 1 , wherein the signal deembedding circuit comprises an adaptive filter.

3. The measurement apparatus according to claim 1 , wherein the signal deembedding circuit comprises a filter cascade including at least one equalizing filter.

4. The measurement apparatus according to claim 1 , wherein the signal deembedding circuit comprises a filter cascade including the at least one echo-compensation filter.

5. The measurement apparatus according to claim 1 , further comprising:
a trigger circuit, disposed between the signal deembedding circuit and the signal processor, configured to generate a trigger signal for the time-domain measurement.

6. The measurement apparatus according to claim 1 , further comprising:
an adaptation circuit configured to determine the S-parameters associated with the DUT.

7. The measurement apparatus according to claim 1 , wherein the signal deembedding circuit comprises at least one finite impulse response (FIR) filter.

8. A method for measuring a high-frequency signal, wherein the measurement comprises a time-domain measurement in real-time, the method comprising:
receiving, by a measurement device, the high-frequency signal from a device under test (DUT);
digitizing, by an analog to digital converter, the high-frequency signal;
configuring a signal deembedding circuit for the DUT based on predetermined S-parameters,
generating, by the signal deembedding circuit, a compensated signal by compensating for signal effects in the high-frequency signal resulting from an interface between the DUT and the measurement device, wherein the signal effects include echoes due to error matchings of the interface, wherein the compensating for the signal effects in the high-frequency signal comprises compensating, by at least one echo-compensation filter, for the echoes, and wherein the signal deembedding circuit facilitates a correction calculation on the digital plane in order to correct measurement errors which are superposed on the high-frequency signal to be measured; and
processing, by a signal processor, the compensated signal for the time-domain measurement.

9. The method according to claim 8 , wherein the compensating for the signal effects in the high-frequency signal comprises at least one correction of a decline in a frequency response by means of an equalizing filter.

10. The method according to claim 8 , wherein the compensating for the signal effects in the high-frequency signal comprises at least one registration of echoes of the high-frequency signal and a filtering out of the registered echoes by means of the at least one echo-compensation filter.

11. The method according to claim 8 , further comprising:
determining the S-parameters associated with the DUT; and
configuring the measurement device for the DUT based on the determined S-parameters.

Assignees

• Rohde & Schwarz

Inventors

• Kuhwald Thomas

Classifications

• G01R13/0254

  for triggering, synchronisation · CPC title

• G01R35/002 Primary

  of cathode ray oscilloscopes · CPC title

• G01R13/029

  Software therefor · CPC title

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title