Test fixture, calibration setup and method of calibrating a test and/or measurement instrument
US-2026003020-A1 · Jan 1, 2026 · US
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of cathode ray oscilloscopes
of cathode ray oscilloscopes · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R35/002 |
| Official title | {of cathode ray oscilloscopes} |
| Display label | of cathode ray oscilloscopes |
| Total patents | 12 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2016 | 1 |
| 2018 | 1 |
| 2019 | 1 |
| 2020 | 3 |
| 2021 | 1 |
| 2022 | 1 |
| 2023 | 1 |
| 2025 | 1 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Multiple output instrument calibrator
US-2025164594-A1 · May 22, 2025 · US
Method of customized setting as well as measurement system
US-11619920-B2 · Apr 4, 2023 · US
Automatic detection of logical path segments in a measurement population
US-11237190-B2 · Feb 1, 2022 · US
Test system and method for testing a device under test having several communication lanes
US-10969455-B2 · Apr 6, 2021 · US
Method of customized setting as well as measurement system
US-2020319615-A1 · Oct 8, 2020 · US
Interactive instrument measurement analytics
US-2020233016-A1 · Jul 23, 2020 · US
Test system as well as method for testing a device under test
US-2020116812-A1 · Apr 16, 2020 · US
Measuring device and a method for measuring a high-frequency signal with deembedding
US-10168411-B2 · Jan 1, 2019 · US
Probe for a signal analyzing device
US-2018088151-A1 · Mar 29, 2018 · US
A measuring device and a method for measuring a high-frequency signal with deembedding
US-2016252600-A1 · Sep 1, 2016 · US
Time-domain reflectometer de-embed probe
US-2015084660-A1 · Mar 26, 2015 · US