Automatic detection of logical path segments in a measurement population

Patent metadata

Field	Value
Publication number	US-11237190-B2
Application number	US-202016734756-A
Country	US
Kind code	B2
Filing date	Jan 6, 2020
Priority date	Jan 21, 2019
Publication date	Feb 1, 2022
Grant date	Feb 1, 2022

Abstract

A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.

First claim

We claim:

1. A test and measurement instrument, comprising:
a memory configured to store a waveform data record;
one or more processors configured to:
receive the waveform data record,
determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record,
detect one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event, and
generate a visual representation of each measurement value and overlay each of the visual representations of each measurement value; and

a display configured to display the visual representations of the measurement values.

2. The test and measurement instrument of claim 1 , wherein the one or more processors are further configured to separate each of the one or more logical path segments and the display is further configured to display each of the logical path segments.

3. The test and measurement instrument of claim 2 , wherein the display is further configured to display each of the logical path segments concurrently with the visual representations of the measurement values.

4. The test and measurement instrument of claim 1 , wherein the one or more processors are further configured to detect the one or more logical path segments by pattern recognition.

5. The test and measurement instrument of claim 4 , wherein the pattern recognition includes generating a grid of cells based on each of the measurement values, and grouping similar adjacent grid cells.

6. The test and measurement instrument of claim 4 , wherein the one or more processors are further configured to detect the one or more logical path segments by pattern recognition by associating the measurement values using a density analysis.

7. The test and measurement instrument of claim 1 , further comprising a user input, wherein the one or more processors are further configured to filter the detected one or more logical path segments based on the user input.

8. The test and measurement instrument of claim 1 , wherein the measurement event is one of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

9. The test and measurement instrument of claim 1 , wherein the measurement event is a first measurement event, and the one or more processors are further configured to generate a histogram of measurement values associated with the first measurement event, determine a measurement value and location for a plurality of occurrences of a second measurement event in the waveform data record different from the first measurement event, and generate a second histogram of measurement values associated with the second measurement event.

10. A method for automatically detecting logical path segments in a measurement population, comprising:
determining a measurement value and location for a plurality of occurrences of a measurement event in a waveform data record;
detecting one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event;
generating a visual representation of each measurement value and overlaying each visual representation of each measurement value; and
displaying on a display each visual representation of each measurement value.

11. The method of claim 10 , further comprising:
separating each of the one or more logical path segments; and
displaying each of the logical path segments.

12. The method of claim 11 , further comprising displaying each of the logical path segments concurrently with the visual representation of each measurement value.

13. The method of claim 10 , wherein detecting the one or more logical path segments comprises pattern recognition.

14. The method of claim 13 , wherein the pattern recognition includes generating a grid of cells based on each of the measurement values, and grouping similar adjacent grid cells.

15. The method of claim 13 , wherein the pattern recognition includes associating the measurement values using a density analysis.

16. The method of claim 10 , further comprising filtering the detected one or more logical path segments based on a user input.

17. The method of claim 10 , wherein the measurement event is one of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

18. One or more non-transitory computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:
determine a measurement value and location for a plurality of occurrences of a measurement event in a waveform data record;
detect one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event;
generate a visual representation of each measurement value and overlay each of the visual representations of each measurement value; and
display on a display the overlaid visual representations of each measurement value.

19. The one or more non-transitory computer-readable storage media of claim 18 , further including instructions that cause the test and measurement instrument to display each of the logical path segments concurrently with the overlaid visual representation.

20. The one or more non-transitory computer-readable storage media of claim 18 , wherein the measurement event is one of a rising edge measurement, a falling edge measurement, a rising and falling edge measurement, an edge measurement, a long bit measurement, or a custom measurement.

Assignees

• Tektronix Inc

Inventors

• Rule Keith D
• Marty Sean T

Classifications

• G06F18/23

  Clustering techniques · CPC title

• G01R13/28 Primary

  Circuits for simultaneous or sequential presentation of more than one variable · CPC title

• G01R35/00

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01D18/00 Primary

  Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 · CPC title

• G06N20/00

  Machine learning · CPC title