Test system and method for testing a device under test having several communication lanes

Patent metadata

Field	Value
Publication number	US-10969455-B2
Application number	US-201816162149-A
Country	US
Kind code	B2
Filing date	Oct 16, 2018
Priority date	Oct 16, 2018
Publication date	Apr 6, 2021
Grant date	Apr 6, 2021

Abstract

A test system for testing a device under test that includes several communication lanes is described. The test system is a communication lane test system that includes a measurement instrument and a connecting interface for connecting the device under test, wherein the connecting interface is configured to connect at least two of the several communication lanes with the measurement instrument. The measurement instrument includes s a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently. Moreover, a method for testing a device under test that includes s several communication lanes is described.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1. A test system for testing a device under test that comprises several communication lanes, the test system being a communication lane test system that comprises: a measurement instrument and a connecting interface for connecting the device under test, the connecting interface being configured to connect at least two of the several communication lanes with the measurement instrument, and the measurement instrument comprising a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently, wherein the processor is configured to conduct the automatic conformance test on the at least two communication lanes individually, wherein the connecting interface comprises a switch being configured to selectively connect at least two of the several communication lanes with the measurement instrument.

2. The test system of claim 1 , wherein the connecting interface is configured to connect all communication lanes of the device under test to the measurement instrument.

3. The test system of claim 2 , wherein the processor is configured to conduct the automatic conformance test on all communication lanes concurrently.

4. The test system of claim 1 , wherein the measurement instrument is established as an oscilloscope.

5. The test system of claim 1 , wherein the measurement instrument is configured to conduct the automatic conformance test in at least one of real time and post-processing.

6. The test system of claim 1 , comprising a control unit being configured to control at least one of the processor or the device under test.

7. The test system of claim 1 , wherein the connecting interface is established by a separately formed test fixture connected to the measurement instrument.

8. The test system of claim 1 , wherein the connecting interface is established at the measurement instrument directly.

9. The test system of claim 1 , wherein the connecting interface comprises a lane connecting element being configured to at least one of connect several of the communication lanes with the measurement instrument and to connect several of the communication lanes with each other.

10. The test system of claim 1 , wherein the connecting interface comprises at least one of a load element or a terminating element for each of the several communication lanes.

11. The test system of claim 1 , wherein the connecting interface comprises a probe element for several of the communication lanes, each of the probe elements being configured to receive a signal propagating in the respective communication lane and to forward the received signal to the measurement unit.

12. The test system of claim 1 , wherein a device under test is provided that comprises several communication lanes, at least two of the several communication lanes of the device under test being connected to the measurement instrument by the connecting interface, and the measurement instrument comprising a processor being configured to conduct an automatic conformance test on the at least two communication lanes concurrently.

13. The measurement system of claim 12 , wherein the device under test comprises at least four communication lanes.

14. The measurement system of claim 12 , wherein the connecting interface connects all communication lanes of the device under test to the measurement instrument.

15. A method for testing a device under test that comprises several communication lanes, comprising the following steps:
providing a measurement instrument and a device under test with several communication channels;
selectively connecting at least two of the several communication channels to the measurement instrument via a switch of a connecting interface; and
conducting an automatic conformance test on the several communication lanes concurrently via the measurement instrument, wherein the automatic conformance test is conducted on the several communication lanes individually.

16. The method of claim 15 , wherein the connecting interface is established by a separately formed test fixture that is interconnected between the device under test and the measurement instrument.

Assignees

• Rohde & Schwarz

Inventors

• Jin Yi
• Wong Kok Meng
• Tost Johann

Classifications

• G01R31/31905 Primary

  Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture · CPC title

• G01R35/002 Primary

  of cathode ray oscilloscopes · CPC title

• G01R31/31908

  Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns · CPC title