Wafer processing method
US-2016343614-A1 · Nov 24, 2016 · US
US10022838B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10022838-B2 |
| Application number | US-201615331450-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 21, 2016 |
| Priority date | Oct 21, 2015 |
| Publication date | Jul 17, 2018 |
| Grant date | Jul 17, 2018 |
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Disclosed herein is a cutting apparatus including a moving unit for moving a spindle to position a cutting blade, a rotary dressing mechanism for rotating a dressing grindstone on a rotational shaft parallel to the spindle, and an optical sensor for detecting the position of the outer periphery of the dressing grindstone. The cutting blade is positioned with respect to the rotary dressing mechanism depending on the position, detected by the optical sensor, of the outer periphery of the dressing grindstone, and the cutting blade is dressed by cutting into the dressing grindstone by a predetermined cutting distance.
Opening claim text (preview).
What is claimed is: 1. A cutting apparatus comprising: a chuck table for holding a workpiece thereon; cutting means for cutting the workpiece held on said chuck table with a cutting blade mounted on a spindle, while supplying a cutting fluid to said cutting blade; moving means for moving said spindle to position said cutting blade; rotary dressing means for rotating a dressing grindstone on a rotational shaft parallel to said spindle; and an optical sensor for detecting the position of the outer periphery of said dressing grindstone, wherein said cutting blade is positioned with respect to said rotary dressing means depending on the position, detected by said optical sensor, of the outer periphery of said dressing grindstone, and said cutting blade is dressed by cutting into said dressing grindstone by a predetermined cutting distance. 2. The cutting apparatus according to claim 1 , wherein said optical sensor is positioned to apply an inspection light beam emitted therefrom toward the rotational shaft of said dressing grindstone to the outer peripheral surface of said dressing grindstone, said cutting apparatus further comprises calculating means for calculating the diameter of said dressing grindstone on the basis of light reflected from the outer peripheral surface of said dressing grindstone to which said inspection light beam is applied, and said cutting blade is positioned with respect to said rotary dressing means on the basis of the diameter of the dressing grindstone which is calculated by said calculating means, and said cutting blade is dressed by cutting into said dressing grindstone by said predetermined cutting distance. 3. The cutting apparatus according to claim 1 , further comprising: a casing housing said optical sensor therein, said casing having an opening for passing the inspection light beam emitted from said optical sensor therethrough; and air curtain forming means disposed near said opening, wherein an air curtain formed by said air curtain forming means prevents debris and a cutting fluid from entering said casing through said opening and being applied to said optical sensor.
Grinding, lapping or polishing of wafers, substrates or parts of devices · CPC title
Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material (B28D5/0005, B28D5/024 take precedence) · CPC title
the supporting or holding device being of the vacuum type · CPC title
by cutting with discs or wheels · CPC title
using rotary dressing tools (B24B53/07 takes precedence) · CPC title
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