High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopy
US-11139142-B2 · Oct 5, 2021 · US
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Yuli Ofer patents
Yuli Ofer is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yuli Ofer |
| Total patents | 4 |
| First publication | Nov 26, 2020 |
| Latest publication | Oct 5, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beam
US-2021090852-A1 · Mar 25, 2021 · US
Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beam
US-10943763-B1 · Mar 9, 2021 · US
High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopy
US-2020373120-A1 · Nov 26, 2020 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 4 |
| H10P74/203 | 4 |
| H01J37/28 | 4 |
| H01J37/222 | 4 |
| H01J2237/221 | 4 |