Method and System for Shaping Partial Fields
US-2026027756-A1 · Jan 29, 2026 · US
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Simpson Logan L patents
Simpson Logan L is listed as an inventor on 16 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Simpson Logan L |
| Total patents | 16 |
| First publication | Oct 3, 2019 |
| Latest publication | Jan 29, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of measuring edge eccentricity while wafer is on pre-aligner
US-2025198748-A1 · Jun 19, 2025 · US
Method and system for determining initial contact control values for shaping partial fields and method and system for shaping partial fields
US-12235587-B2 · Feb 25, 2025 · US
Method and System for Determining Initial Contact Control Values for Shaping Partial Fields and Method and System for Shaping Partial Fields
US-2024329542-A1 · Oct 3, 2024 · US
Method and apparatus to reduce variation of physical attribute of droplets using performance characteristic of dispensers
US-11927883-B2 · Mar 12, 2024 · US
Fluid droplet methodology and apparatus for imprint lithography
US-11762295-B2 · Sep 19, 2023 · US
Method of determining the initial contact point for partial fields and method of shaping a surface
US-11614693-B2 · Mar 28, 2023 · US
Method of Determining the Initial Contact Point for Partial Fields and Method of Shaping a Surface
US-2023014261-A1 · Jan 19, 2023 · US
Fluid droplet methodology and apparatus for imprint lithography
US-2022128907-A1 · Apr 28, 2022 · US
Residual layer thickness compensation in nano-fabrication by modified drop pattern
US-11215921-B2 · Jan 4, 2022 · US
Recent patents
Latest publications not already listed above.
Methods of generating drop patterns, systems for shaping films with the drop pattern, and methods of manufacturing an article with the drop pattern
US-11209730-B2 · Dec 28, 2021 · US
Dispenser shield with adjustable aperture to improve drop placement and residual layer thickness
US-11040366-B2 · Jun 22, 2021 · US
Residual Layer Thickness Compensation in Nano-Fabrication
US-2021132491-A1 · May 6, 2021 · US
Methods of Generating Drop Patterns, Systems for Shaping Films with the Drop Pattern, and Methods of Manufacturing an Article with the Drop Pattern
US-2020292934-A1 · Sep 17, 2020 · US
Dispenser shield with adjustable aperture to improve drop placement and residual layer thickness
US-2020086339-A1 · Mar 19, 2020 · US
Method and apparatus to reduce variation of physical attribute of droplets using performance characteristic of dispensers
US-2019302610-A1 · Oct 3, 2019 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Canon Kk | 16 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/0002 | 16 |
| G03F9/7042 | 5 |
| G03F7/70516 | 4 |
| B29C43/58 | 3 |
| B29C2043/5833 | 3 |