Optical phase measurement method and system
US-12467879-B2 · Nov 11, 2025 · US
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Shafir Dror patents
Shafir Dror is listed as an inventor on 39 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Shafir Dror |
| Total patents | 39 |
| First publication | Jul 30, 2015 |
| Latest publication | Nov 11, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Optical phase measurement method and system
US-2024361253-A1 · Oct 31, 2024 · US
Method and system for optical characterization of patterned samples
US-2024337590-A1 · Oct 10, 2024 · US
Metrology technique for semiconductor devices
US-2024271926-A1 · Aug 15, 2024 · US
Optical phase measurement system and method
US-11946875-B2 · Apr 2, 2024 · US
Method and system for optical characterization of patterned samples
US-11885737-B2 · Jan 30, 2024 · US
Optical phase measurement system and method
US-2023130231-A1 · Apr 27, 2023 · US
Time-domain optical metrology and inspection of semiconductor devices
US-2022390858-A1 · Dec 8, 2022 · US
Optical phase measurement system and method
US-11460415-B2 · Oct 4, 2022 · US
Time-domain optical metrology and inspection of semiconductor devices
US-11366398-B2 · Jun 21, 2022 · US
Recent patents
Latest publications not already listed above.
Optical phase measurement method and system
US-2021364451-A1 · Nov 25, 2021 · US
Time-domain optical metrology and inspection of semiconductor devices
US-2021247699-A1 · Aug 12, 2021 · US
Optical phase measurement method and system
US-11029258-B2 · Jun 8, 2021 · US
Method and system for optical characterization of patterned samples
US-2021116359-A1 · Apr 22, 2021 · US
Method and system for optical characterization of patterned samples
US-10876959-B2 · Dec 29, 2020 · US
Optical phase measurement system and method
US-2020355622-A1 · Nov 12, 2020 · US
Optical system and method for measurements of samples
US-10739277-B2 · Aug 11, 2020 · US
Optical phase measurement system and method
US-10663408-B2 · May 26, 2020 · US
Optical phase measurement system and method
US-2020025693-A1 · Jan 23, 2020 · US
Optical critical dimension metrology
US-10365163-B2 · Jul 30, 2019 · US
Optical phase measurement method and system
US-10365231-B2 · Jul 30, 2019 · US
Overlay design optimization
US-10311198-B2 · Jun 4, 2019 · US
Optical phase measurement method and system
US-2019154594-A1 · May 23, 2019 · US
Optical system and method for measurements of samples
US-2019128823-A1 · May 2, 2019 · US
Optical critical dimension metrology
US-2019063999-A1 · Feb 28, 2019 · US
Optical phase measurement method and system
US-10161885-B2 · Dec 25, 2018 · US
Method and system for optical characterization of patterned samples
US-2018328837-A1 · Nov 15, 2018 · US
Optical method and system for measuring isolated features of a structure
US-10073045-B2 · Sep 11, 2018 · US
Optical method and system for critical dimensions and thickness characterization
US-10054423-B2 · Aug 21, 2018 · US
Optical critical dimension metrology
US-10041838-B2 · Aug 7, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nova Measuring Instr Ltd | 29 |
| Nova Ltd | 10 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/956 | 31 |
| G01B2210/56 | 29 |
| G01N21/9501 | 24 |
| G01N21/8806 | 17 |
| G01N2021/8848 | 15 |