Inspection apparatus and inspection method
US-2016370300-A1 · Dec 22, 2016 · US
Polarisation of light
Polarisation of light · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2021/8848 |
| Official title | {Polarisation of light} |
| Display label | Polarisation of light |
| Total patents | 519 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 37 |
| 2016 | 36 |
| 2017 | 48 |
| 2018 | 50 |
| 2019 | 43 |
| 2020 | 45 |
| 2021 | 51 |
| 2022 | 31 |
| 2023 | 44 |
| 2024 | 48 |
| 2025 | 67 |
| 2026 | 19 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Scattered light measurement system
US-9518930-B2 · Dec 13, 2016 · US
Defect inspection method and its device
US-9513228-B2 · Dec 6, 2016 · US
System and Method for Oblique Incidence Scanning with 2D Array of Spots
US-2016327493-A1 · Nov 10, 2016 · US
Method and system for improving optical measurements on small targets
US-9476837-B2 · Oct 25, 2016 · US
Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample
US-9448161-B2 · Sep 20, 2016 · US
Optical module for surface inspection and surface inspection apparatus including the same
US-9429525-B2 · Aug 30, 2016 · US
System and method for semiconductor wafer inspection and metrology
US-2016202177-A1 · Jul 14, 2016 · US
Inspection device of display device and inspection method of display device
US-2016187262-A1 · Jun 30, 2016 · US
Polarization measurements of metrology targets and corresponding target designs
US-2016178351-A1 · Jun 23, 2016 · US
Remote connection system for an aircraft
US-2016178531-A1 · Jun 23, 2016 · US
Inspection device and inspection method
US-9360436-B2 · Jun 7, 2016 · US
Surface Inspecting Method
US-2016153915-A1 · Jun 2, 2016 · US
Inspection systems and techniques with enhanced detection
US-2016153914-A1 · Jun 2, 2016 · US
Defect inspecting method and defect inspecting apparatus
US-2016116421-A1 · Apr 28, 2016 · US
Non-linear optical ellipsometry for surface monitoring and characterization
US-2016116396-A1 · Apr 28, 2016 · US
Multiple angles of incidence semiconductor metrology systems and methods
US-9310290-B2 · Apr 12, 2016 · US
Defect inspection method and defect inspection device
US-9310318-B2 · Apr 12, 2016 · US
Method and system for improving optical measurements on small targets
US-2016084773-A1 · Mar 24, 2016 · US
Defect detection method and defect detection device and defect observation device provided with same
US-2016069816-A1 · Mar 10, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N2021/8848?
- CPC G01N2021/8848 is the Cooperative Patent Classification code for “Polarisation of light.”
- How many patents are filed under CPC G01N2021/8848 (Polarisation of light)?
- Our database includes 519 publications tagged with this CPC code.
- Is patent activity under CPC G01N2021/8848 growing?
- Publication counts under this code: 48 in 2024 vs 67 in 2025 (latest complete years).