In-situ full wafer metrology system
US-11204312-B2 · Dec 21, 2021 · US
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Sade Ami patents
Sade Ami is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Sade Ami |
| Total patents | 4 |
| First publication | Jul 11, 2019 |
| Latest publication | Dec 21, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
In-situ full wafer metrology system
US-2021285865-A1 · Sep 16, 2021 · US
Substrate carrier having hard mask
US-11047039-B2 · Jun 29, 2021 · US
Substrate carrier having hard mask
US-2019211442-A1 · Jul 11, 2019 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 2 |
| H10P74/203 | 2 |
| G01N21/9501 | 2 |
| G01B11/0625 | 2 |
| G01N21/01 | 2 |