Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface
US-10431505-B2 · Oct 1, 2019 · US
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Park Jun-Bum patents
Park Jun-Bum is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Park Jun-Bum |
| Total patents | 7 |
| First publication | Jul 28, 2016 |
| Latest publication | Oct 1, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
Clock signal generators and substrate inspecting apparatuses having the same
US-10338370-B2 · Jul 2, 2019 · US
Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatus
US-2018144995-A1 · May 24, 2018 · US
Inspecting surfaces
US-2017352599-A1 · Dec 7, 2017 · US
Clock signal generators and substrate inspecting apparatuses having the same
US-2017336616-A1 · Nov 23, 2017 · US
Method of operating memory controller and semiconductor storage device including memory controller
US-9804790-B2 · Oct 31, 2017 · US
Method of operating memory controller and semiconductor storage device including memory controller
US-2016216899-A1 · Jul 28, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 8 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 5 |
| G01N21/8806 | 3 |
| H10P74/235 | 3 |
| H10P74/203 | 3 |
| H01L22/12 | 3 |