Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2025264813-A1 · Aug 21, 2025 · US
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Menger Jasper patents
Menger Jasper is listed as an inventor on 19 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Menger Jasper |
| Total patents | 19 |
| First publication | Aug 25, 2016 |
| Latest publication | Aug 21, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-12287584-B2 · Apr 29, 2025 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-11940740-B2 · Mar 26, 2024 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2024019788-A1 · Jan 18, 2024 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2022326623-A1 · Oct 13, 2022 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-11385550-B2 · Jul 12, 2022 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-11300891-B2 · Apr 12, 2022 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-2021191286-A1 · Jun 24, 2021 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-10859930-B2 · Dec 8, 2020 · US
Methods & apparatus for obtaining diagnostic information relating to an industrial process
US-2020264520-A1 · Aug 20, 2020 · US
Recent patents
Latest publications not already listed above.
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-10642162-B2 · May 5, 2020 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-2020057395-A1 · Feb 20, 2020 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-10495990-B2 · Dec 3, 2019 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2019278188-A1 · Sep 12, 2019 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-10274834-B2 · Apr 30, 2019 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2018253015-A1 · Sep 6, 2018 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-9946165-B2 · Apr 17, 2018 · US
Methods and apparatus for calculating substrate model parameters and controlling lithographic processing
US-2017277045-A1 · Sep 28, 2017 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2016246185-A1 · Aug 25, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asml Netherlands Bv | 20 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70633 | 13 |
| G03F7/70508 | 13 |
| G06F16/26 | 13 |
| G03F9/7092 | 13 |
| G03F7/70616 | 13 |