Carrier based high volume system level testing of devices with pop structures
US-12374420-B2 · Jul 29, 2025 · US
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Leventhal Ira patents
Leventhal Ira is listed as an inventor on 22 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Leventhal Ira |
| Total patents | 22 |
| First publication | Jan 28, 2021 |
| Latest publication | Jul 29, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US-12320852-B2 · Jun 3, 2025 · US
Shielded socket and carrier for high-volume test of semiconductor devices
US-12203958-B2 · Jan 21, 2025 · US
Systems and methods for multidimensional dynamic part average testing
US-12007428-B2 · Jun 11, 2024 · US
Thermal solution for massively parallel testing
US-11940487-B2 · Mar 26, 2024 · US
Shielded socket and carrier for high-volume test of semiconductor devices
US-2024027492-A1 · Jan 25, 2024 · US
Shielded socket and carrier for high-volume test of semiconductor devices
US-11821913-B2 · Nov 21, 2023 · US
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US-11808812-B2 · Nov 7, 2023 · US
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US-2023314512-A1 · Oct 5, 2023 · US
Carrier based high volume system level testing of devices with pop structures
US-11742055-B2 · Aug 29, 2023 · US
Recent patents
Latest publications not already listed above.
Thermal solution for massively parallel testing
US-2023228812-A1 · Jul 20, 2023 · US
Carrier based high volume system level testing of devices with pop structures
US-2023197185-A1 · Jun 22, 2023 · US
Systems and methods for multidimensional dynamic part average testing
US-2023111543-A1 · Apr 13, 2023 · US
Carrier based high volume system level testing of devices with pop structures
US-2023062440-A1 · Mar 2, 2023 · US
Carrier based high volume system level testing of devices with pop structures
US-11587640-B2 · Feb 21, 2023 · US
Thermal solution for massively parallel testing
US-11549981-B2 · Jan 10, 2023 · US
Carrier based high volume system level testing of devices with pop structures
US-2022284982-A1 · Sep 8, 2022 · US
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US-2022137129-A1 · May 5, 2022 · US
Shielded socket and carrier for high-volume test of semiconductor devices
US-2022137092-A1 · May 5, 2022 · US
Thermal solution for massively parallel testing
US-2022107360-A1 · Apr 7, 2022 · US
Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program
US-11244443-B2 · Feb 8, 2022 · US
Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program
US-2021027443-A1 · Jan 28, 2021 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Advantest Test Solutions Inc | 18 |
| Advantest Corp | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2863 | 14 |
| G01R31/2891 | 12 |
| G01R31/2868 | 12 |
| G01R31/2867 | 10 |
| G01R31/31905 | 10 |