Power Conversion Module And Uninterruptible Power Supply
US-2026025962-A1 · Jan 22, 2026 · US
This page is not indexed by search engines while we improve data quality.
Hu Dawei patents
Hu Dawei is listed as an inventor on 30 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hu Dawei |
| Total patents | 30 |
| First publication | Mar 14, 2017 |
| Latest publication | Jan 22, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Measurements of semiconductor structures based on spectral differences at different process steps
US-12532710-B2 · Jan 20, 2026 · US
Hydrogenation catalyst and preparation method therefor and use thereof
US-12502654-B2 · Dec 23, 2025 · US
Process and system for hydrotreating deoiled asphalt
US-12467004-B2 · Nov 11, 2025 · US
Process and system for processing aromatics-rich fraction oil
US-12331256-B2 · Jun 17, 2025 · US
Measurements Of Semiconductor Structures Based On Spectral Differences At Different Process Steps
US-2024186191-A1 · Jun 6, 2024 · US
Hydrogenation catalyst and preparation method therefor and use thereof
US-2023211316-A1 · Jul 6, 2023 · US
Scatterometry based methods and systems for measurement of strain in semiconductor structures
US-11573077-B2 · Feb 7, 2023 · US
Process and system for processing aromatics-rich fraction oil
US-2022403263-A1 · Dec 22, 2022 · US
Process and system for hydrotreating deoiled asphalt
US-2022372385-A1 · Nov 24, 2022 · US
Recent patents
Latest publications not already listed above.
Combined rock-breaking TBM tunneling method in complex strata for realizing three-way force detection
US-11486249-B2 · Nov 1, 2022 · US
Rock high-stress high-temperature micro-nano indentation test system
US-11415498-B2 · Aug 16, 2022 · US
Device and method for measuring radon release amount during rock shearing damage process
US-2022074906-A1 · Mar 10, 2022 · US
Multi-environment polarized infrared reflectometer for semiconductor metrology
US-11231362-B1 · Jan 25, 2022 · US
Measurement methodology of advanced nanostructures
US-11156548-B2 · Oct 26, 2021 · US
Scatterometry Based Methods And Systems For Measurement Of Strain In Semiconductor Structures
US-2021293532-A1 · Sep 23, 2021 · US
Scatterometry based methods and systems for measurement of strain in semiconductor structures
US-11060846-B2 · Jul 13, 2021 · US
Method for determining segmentation threshold of digital image of rock-soil material
US-2021201497-A1 · Jul 1, 2021 · US
Rock high-stress high-temperature micro-nano indentation test system
US-2021123844-A1 · Apr 29, 2021 · US
Combined rock-breaking tbm tunneling method in complex strata for realizing three-way force detection
US-2021003009-A1 · Jan 7, 2021 · US
Dispersion model for band gap tracking
US-10770362-B1 · Sep 8, 2020 · US
Scatterometry Based Methods And Systems For Measurement Of Strain In Semiconductor Structures
US-2020200525-A1 · Jun 25, 2020 · US
Ring shear and seepage-coupled apparatus and ring shear and seepage-coupled test system for rock and rock fracture under tension or compression stress
US-10684203-B2 · Jun 16, 2020 · US
Dispersion model for band gap tracking
US-10410935-B1 · Sep 10, 2019 · US
Measurement Methodology of Advanced Nanostructures
US-2019178788-A1 · Jun 13, 2019 · US
Ring Shear and Seepage-Coupled Apparatus and Ring Shear and Seepage-Coupled Test System for Rock and Rock Fracture under Tension or Compression Stress
US-2019011344-A1 · Jan 10, 2019 · US
Rock hollow cylinder torsional shear apparatus
US-10012577-B2 · Jul 3, 2018 · US
Rock Hollow Cylinder Torsional Shear Apparatus
US-2018136099-A1 · May 17, 2018 · US
Process for hydrotreating heavy raw oils
US-9657236-B2 · May 23, 2017 · US
Dispersion model for band gap tracking
US-9595481-B1 · Mar 14, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Inst Rock & Soil Mech Cas | 9 |
| Kla Corp | 8 |
| China Petroleum & Chem Corp | 7 |
| Sinopec Res Inst Petroleum | 5 |
| Kla Tencor Corp | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 11 |
| G01N21/9501 | 8 |
| G01N2021/213 | 7 |
| G01N2203/0048 | 7 |
| H01L22/12 | 7 |