Multi-column scanning electron microscopy system
US-2021090844-A1 · Mar 25, 2021 · US
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Haynes Robert patents
Haynes Robert is listed as an inventor on 10 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Haynes Robert |
| Total patents | 10 |
| First publication | Dec 6, 2016 |
| Latest publication | Mar 25, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Multi-column scanning electron microscopy system
US-10840056-B2 · Nov 17, 2020 · US
Multi-column spacing for photomask and reticle inspection and wafer print check verification
US-10777377-B2 · Sep 15, 2020 · US
Array-based characterization tool
US-10438769-B1 · Oct 8, 2019 · US
Multi-column scanning electron microscopy system
US-10354832-B2 · Jul 16, 2019 · US
Multi-Column Scanning Electron Microscopy System
US-2018358200-A1 · Dec 13, 2018 · US
Multi-Column Spacing for Photomask and Reticle Inspection and Wafer Print Check Verification
US-2018233318-A1 · Aug 16, 2018 · US
Multi-Column Scanning Electron Microscopy System
US-2018226219-A1 · Aug 9, 2018 · US
Multi-layer ceramic vacuum to atmosphere electric feed through
US-9591770-B2 · Mar 7, 2017 · US
Apparatus and method for optical inspection, magnetic field and height mapping
US-9513230-B2 · Dec 6, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 9 |
| Kla Corp | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 8 |
| H01J37/1471 | 6 |
| H01J37/285 | 5 |
| H01J37/14 | 5 |
| H01J37/1474 | 5 |