Charged particle beam device and method for correcting astigmatism and numerical aperture
US-2026081098-A1 · Mar 19, 2026 · US
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Ehberger Dominik Patrick patents
Ehberger Dominik Patrick is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ehberger Dominik Patrick |
| Total patents | 5 |
| First publication | Nov 10, 2022 |
| Latest publication | Mar 19, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of forming a multipole device, method of influencing an electron beam, and multipole device
US-12451322-B2 · Oct 21, 2025 · US
Method of forming a multipole device, method of influencing an electron beam, and multipole device
US-2024274396-A1 · Aug 15, 2024 · US
Charged particle beam apparatus and method of controlling sample charge
US-11545338-B2 · Jan 3, 2023 · US
Charged particle beam apparatus and method of controlling sample charge
US-2022359152-A1 · Nov 10, 2022 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | 5 |
| Ict Integrated Circuit Testing Ges Fuer Halbleiterriftechnik Mbh | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 4 |
| H01J37/153 | 3 |
| H01J2237/049 | 2 |
| H01J37/20 | 2 |
| H01J2237/2817 | 2 |