Generating a wafer inspection process using bit failures and virtual inspection
US-10014229-B2 · Jul 3, 2018 · US
Du Yuezhong is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Du Yuezhong |
| Total patents | 3 |
| First publication | Mar 1, 2016 |
| Latest publication | Jul 3, 2018 |
Publications ranked by popularity score, then publication date.
US-10014229-B2 · Jul 3, 2018 · US
US-2016163606-A1 · Jun 9, 2016 · US
US-9277186-B2 · Mar 1, 2016 · US
Latest publications not already listed above.
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 5 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/207 | 3 |
| H10P74/203 | 3 |
| H10P74/23 | 3 |
| H04N7/18 | 3 |
| G06T2207/30148 | 3 |