Semiconductor device for particle measurement and method for operating the semiconductor device
US-12405202-B2 · Sep 2, 2025 · US
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Debie Derek patents
Debie Derek is listed as an inventor on 11 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Debie Derek |
| Total patents | 11 |
| First publication | Feb 14, 2019 |
| Latest publication | Sep 2, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Radiation source device
US-2025060338-A1 · Feb 20, 2025 · US
Radiation source device
US-12158448-B2 · Dec 3, 2024 · US
Ultrasonic touch sensor with backlight
US-12079431-B1 · Sep 3, 2024 · US
Operating element having haptic feedback
US-2024170197-A1 · May 23, 2024 · US
Wafer composite, semiconductor device and methods of manufacturing a semiconductor circuit
US-2024112956-A1 · Apr 4, 2024 · US
Radiation source device
US-2023194478-A1 · Jun 22, 2023 · US
Method for producing a nanofilm, sensor arrangement comprising a nanofilm, and nanosieve comprising a nanofilm
US-11378536-B2 · Jul 5, 2022 · US
Tilted chip assembly for optical devices
US-10571682-B2 · Feb 25, 2020 · US
Method for producing a nanofilm, sensor arrangement comprising a nanofilm, and nanosieve comprising a nanofilm
US-2019376918-A1 · Dec 12, 2019 · US
Recent patents
Latest publications not already listed above.
Tilted chip assembly for optical devices
US-2019049716-A1 · Feb 14, 2019 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Infineon Technologies Ag | 10 |
| Infineon Technologies Austria Ag | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N29/222 | 3 |
| G01N29/2425 | 3 |
| G01N29/02 | 3 |
| G01N2291/021 | 3 |
| G01N25/00 | 3 |