Machine learning-based transformation of low-resolution wafer inspection images to high resolution images
US-12540904-B2 · Feb 3, 2026 · US
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Chen To-Yu patents
Chen To-Yu is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Chen To-Yu |
| Total patents | 6 |
| First publication | Jan 1, 2015 |
| Latest publication | Feb 3, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Defect inspection method and defect inspection system
US-2025027886-A1 · Jan 23, 2025 · US
Systems and methods for inspecting semiconductor devices
US-2024255435-A1 · Aug 1, 2024 · US
Wafer charging electromagnetic inspection tool and method of using
US-9423359-B2 · Aug 23, 2016 · US
Defect determination in integrated circuit manufacturing process
US-9098894-B2 · Aug 4, 2015 · US
Wafer charging electromagnetic inspection tool and method of using
US-2015002835-A1 · Jan 1, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Taiwan Semiconductor Mfg Co Ltd | 4 |
| Taiwan Semiconductor Mfg | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 5 |
| G01N21/9501 | 5 |
| H01L22/12 | 4 |
| G01N21/88 | 2 |
| G06T7/001 | 2 |