Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view
US-10684307-B2 · Jun 16, 2020 · US
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Brandner Markus patents
Brandner Markus is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Brandner Markus |
| Total patents | 4 |
| First publication | May 24, 2018 |
| Latest publication | Jun 16, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
Characterizing a height profile of a sample by side view imaging
US-10488434-B2 · Nov 26, 2019 · US
Characterizing a Height Profile of a Sample by Side View Imaging
US-2019049486-A1 · Feb 14, 2019 · US
Imaging a Gap Between Sample and Probe of a Scanning Probe Microscope in a Substantially Horizontal Side View
US-2018143221-A1 · May 24, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Anton Paar Gmbh | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01Q20/02 | 4 |
| G01Q10/06 | 4 |
| G01Q30/02 | 4 |
| G01Q30/025 | 2 |
| G01Q30/04 | 2 |