Probe system, method for wafer test management system in a probe system, and non-transitory computer-readable medium thereof
US-2025191946-A1 · Jun 12, 2025 · US
Berg Ingo is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Berg Ingo |
| Total patents | 2 |
| First publication | May 4, 2021 |
| Latest publication | Jun 12, 2025 |
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Mpi Corp | 2 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 1 |
| H10P74/23 | 1 |
| G01Q70/06 | 1 |
| G01Q20/02 | 1 |
| H10P74/27 | 1 |