Real-equivalent-time oscilloscope and wideband real-time spectrum analyzer
US-12574039-B2 · Mar 10, 2026 · US
Converters having special provisions for facilitating access for testing purposes
Converters having special provisions for facilitating access for testing purposes · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H03M1/108 |
| Official title | {Converters having special provisions for facilitating access for testing purposes} |
| Display label | Converters having special provisions for facilitating access for testing purposes |
| Total patents | 30 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2017 | 1 |
| 2018 | 3 |
| 2019 | 2 |
| 2020 | 4 |
| 2021 | 3 |
| 2022 | 3 |
| 2023 | 2 |
| 2024 | 7 |
| 2025 | 3 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Single event effect detection and circumvention in ADCs
US-12431910-B2 · Sep 30, 2025 · US
Imaging system and imaging device
US-12289550-B2 · Apr 29, 2025 · US
Single event effect detection and circumvention in adcs
US-2025015809-A1 · Jan 9, 2025 · US
DFT architecture for analog circuits
US-12135351-B2 · Nov 5, 2024 · US
Real-equivalent-time oscilloscope and wideband real-time spectrum analyzer
US-2024313795-A1 · Sep 19, 2024 · US
Imaging system and imaging device
US-2024155264-A1 · May 9, 2024 · US
Testing of on-chip analog-mixed signal circuits using on-chip memory
US-11961577-B2 · Apr 16, 2024 · US
Imaging system and imaging device
US-11902681-B2 · Feb 13, 2024 · US
Testing of on-chip analog-mixed signal circuits using on-chip memory
US-2024013848-A1 · Jan 11, 2024 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-11867757-B2 · Jan 9, 2024 · US
Dft architecture for analog circuits
US-2023243886-A1 · Aug 3, 2023 · US
Imaging system and imaging device
US-11706538-B2 · Jul 18, 2023 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-2022187366-A1 · Jun 16, 2022 · US
Built-in harmonic prediction method for embedded segmented-data-converters and system thereof
US-11296715-B1 · Apr 5, 2022 · US
Testing device and testing method for testing a device under test
US-11280833-B2 · Mar 22, 2022 · US
Circuit arrangement comprising a microprocessor and a voltage generating circuit
US-11067626-B2 · Jul 20, 2021 · US
Imaging system and imaging device
US-2021152768-A1 · May 20, 2021 · US
Circuit arrangement comprising a microprocessor and a voltage generating circuit
US-2021011081-A1 · Jan 14, 2021 · US
Method and system to enhance accuracy and resolution of system integrated scope using calibration data
US-10735115-B2 · Aug 4, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H03M1/108?
- CPC H03M1/108 is the Cooperative Patent Classification code for “Converters having special provisions for facilitating access for testing purposes.”
- How many patents are filed under CPC H03M1/108 (Converters having special provisions for facilitating access for testing purposes)?
- Our database includes 30 publications tagged with this CPC code.
- Is patent activity under CPC H03M1/108 growing?
- Publication counts under this code: 7 in 2024 vs 3 in 2025 (latest complete years).