Circuit arrangement comprising a microprocessor and a voltage generating circuit

US11067626B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11067626-B2
Application numberUS-202016846699-A
CountryUS
Kind codeB2
Filing dateApr 13, 2020
Priority dateOct 13, 2017
Publication dateJul 20, 2021
Grant dateJul 20, 2021

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A circuit arrangement includes a microcontroller having a first analog-to-digital converter whose input is connected to the output of a first multiplexer whose output is connected to a first comparison device for comparing reference voltages, and a first serial interface circuit connected to the first comparison device. A voltage generating circuit includes a second analog-to-digital converter whose input is connected to the output of a second multiplexer whose output is connected to a number of registers, which are connected to a safety value generator and store digital values together with a respective safety value, and a second serial interface circuit connected to the registers. The first and second serial interface circuits are connected to each other for communication of the microcontroller with the voltage generating circuit, the first interface circuit being connected to a second comparison device for comparing supply voltages and/or currents with desired voltages and/or desired currents.

First claim

Opening claim text (preview).

The invention claimed is: 1. A circuit arrangement, comprising: a microcontroller comprising a first multiplexer, a first analog-to-digital converter whose input is connected to an output of the first multiplexer, the first multiplexer having a plurality of inputs, a first comparison device having an input connected to an output of the first analog-to-digital converter, the first comparison device comparing reference voltages, a second comparison device, and a first serial interface circuit connected to the first comparison device, and a voltage generating circuit comprising a second multiplexer having a plurality of inputs, a second analog-to-digital converter whose input is connected to an output of the second multiplexer having a plurality of inputs, a plurality of registers, the second multiplexer having an output connected to the registers, a safety value generator connected to the registers, the registers configured to store digital values together with a respective safety value generated by the safety value generator, and a second serial interface circuit connected to the registers, wherein the first and second serial interface circuits are connected to each other for communication of the microcontroller with the voltage generating circuit, and wherein the first interface circuit is connected to the second comparison device for comparing at least one of a plurality of supply voltages with one or more predetermined voltages, and a plurality of supply currents with one or more predetermined currents. 2. The circuit arrangement as claimed in claim 1 , wherein the voltage generating circuit is configured as an integrated circuit with output ports providing the plurality of supply voltages to inputs of the second multiplexer within the integrated circuit. 3. The circuit arrangement as claimed in claim 1 , wherein the safety value generator is configured to generate a time stamp. 4. The circuit arrangement as claimed in claim 1 , wherein the safety value generator includes a message counter. 5. The circuit arrangement as claimed in claim 1 , wherein the safety value generator is configured to generate values of a cyclic redundancy test. 6. A circuit arrangement, comprising: a microcontroller comprising a first multiplexer, a first analog-to-digital converter whose input is connected to an output of the first multiplexer, the first multiplexer having a plurality of inputs, a first comparator device having an input connected to an output of the first analog-to-digital converter, the first comparator device comparing reference voltages, a second comparator device, and a first serial interface circuit connected to the first comparator device, and a voltage generating circuit comprising a second multiplexer having a plurality of inputs, a second analog-to-digital converter whose input is connected to an output of the second multiplexer, a plurality of registers, the second multiplexer having an output connected to an input of the registers, a safety value generator connected to the registers, the registers storing digital values together with a respective safety value generated by the safety value generator, and a second serial interface circuit having an input connected to the registers, wherein the first and second serial interface circuits are connected to each other for communication of the microcontroller with the voltage generating circuit, and wherein the first interface circuit is connected to the second comparator device, the second comparator device comparing at least one of a plurality of supply voltages with one or more predetermined voltages, and a plurality of supply currents with one or more predetermined currents. 7. The circuit arrangement as claimed in claim 6 , wherein the voltage generating circuit comprises an integrated circuit with output ports providing the plurality of supply voltages to inputs of the second multiplexer within the integrated circuit. 8. The circuit arrangement as claimed in claim 6 , wherein the safety value generator generates a time stamp, the safety value comprising the time stamp. 9. The circuit arrangement as claimed in claim 6 , wherein the safety value generator includes a message counter, an output of the message counter comprising the safety value. 10. The circuit arrangement as claimed in claim 6 , wherein the safety value generator generates values of a cyclic redundancy test, the safety value comprising a value for a cyclic redundancy check.

Assignees

Inventors

Classifications

  • Testing of combined analog and digital circuits {(testing ADC's H03M1/1071)} · CPC title

  • H02M1/00Primary

    Details of apparatus for conversion · CPC title

  • Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages · CPC title

  • Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit · CPC title

  • Converters having special provisions for facilitating access for testing purposes · CPC title

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What does patent US11067626B2 cover?
A circuit arrangement includes a microcontroller having a first analog-to-digital converter whose input is connected to the output of a first multiplexer whose output is connected to a first comparison device for comparing reference voltages, and a first serial interface circuit connected to the first comparison device. A voltage generating circuit includes a second analog-to-digital converter …
Who is the assignee on this patent?
Vitesco Tech Gmbh
What technology area does this patent fall under?
Primary CPC classification G01R31/3167. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 20 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).