Structure for particle acceleration and charged particle beam apparatus
US-12586748-B2 · Mar 24, 2026 · US
Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence)
Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence) · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J37/07 |
| Official title | Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence) |
| Display label | Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence) |
| Total patents | 56 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly growing.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 3 |
| 2017 | 5 |
| 2018 | 4 |
| 2019 | 2 |
| 2020 | 6 |
| 2021 | 4 |
| 2022 | 4 |
| 2023 | 5 |
| 2024 | 4 |
| 2025 | 11 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Electron beam adjustment method, electron beam writing apparatus, and non-transitory computer-readable storage medium storing a program
US-2026031298-A1 · Jan 29, 2026 · US
Charged particle beam device
US-12469665-B2 · Nov 11, 2025 · US
Charged particle gun and charged particle beam system
US-12469664-B2 · Nov 11, 2025 · US
Electron source with magnetic suppressor electrode
US-12451319-B2 · Oct 21, 2025 · US
Ultra-high sensitivity hybrid inspection with full wafer coverage capability
US-2025316437-A1 · Oct 9, 2025 · US
Electron gun and electron beam writing apparatus
US-2025273423-A1 · Aug 28, 2025 · US
Charged particle source module
US-12288663-B2 · Apr 29, 2025 · US
Charged particle beam apparatus
US-12283452-B2 · Apr 22, 2025 · US
Dry electron source environment
US-2025125114-A1 · Apr 17, 2025 · US
Charged particle gun and charged particle beam device
US-12266500-B2 · Apr 1, 2025 · US
Charged Particle Beam Apparatus
US-2025079112-A1 · Mar 6, 2025 · US
Thermal conditioning enclosure for a charged particle instrument
US-2025054723-A1 · Feb 13, 2025 · US
Charged particle beam device
US-2024379318-A1 · Nov 14, 2024 · US
Emitter and device provided with same
US-12125663-B2 · Oct 22, 2024 · US
Structure for Particle Acceleration And Charged Particle Beam Apparatus
US-2024242918-A1 · Jul 18, 2024 · US
Emitter and device provided with same
US-2024153730-A1 · May 9, 2024 · US
Electron microscope, electron source for electron microscope, and methods of operating an electron microscope
US-2023197399-A1 · Jun 22, 2023 · US
Charged Particle Gun and Charged Particle Beam System
US-2023178325-A1 · Jun 8, 2023 · US
Charged particle source module
US-2023154719-A1 · May 18, 2023 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J37/07?
- CPC H01J37/07 is the Cooperative Patent Classification code for “Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence).”
- How many patents are filed under CPC H01J37/07 (Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J37/073 - H01J37/077 take precedence))?
- Our database includes 56 publications tagged with this CPC code.
- Is patent activity under CPC H01J37/07 growing?
- Publication counts under this code: 4 in 2024 vs 11 in 2025 (latest complete years).