System and method for autonomous scanning probe microscopy with in-situ tip conditioning
US-2021373045-A1 · Dec 2, 2021 · US
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08)
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q80/00 |
| Official title | Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08) |
| Display label | Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08) |
| Total patents | 128 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 12 |
| 2017 | 11 |
| 2018 | 9 |
| 2019 | 10 |
| 2020 | 11 |
| 2021 | 24 |
| 2022 | 13 |
| 2023 | 13 |
| 2024 | 15 |
| 2025 | 3 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Surface plasmon-optical-electrical hybrid conduction nano heterostructure and preparation method therefor
US-2020400887-A1 · Dec 24, 2020 · US
Thermal nanolithography method and system
US-10852641-B2 · Dec 1, 2020 · US
Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system
US-2020309816-A1 · Oct 1, 2020 · US
Systems and methods for nano-tribological manufacturing of nanostructures
US-10768202-B2 · Sep 8, 2020 · US
Technique for three-dimensional nanoprinting
US-10751933-B2 · Aug 25, 2020 · US
Tuning Local Conductances Of Molecular Networks: Applications To Artificial Neural Networks
US-2020234104-A1 · Jul 23, 2020 · US
Cell for electrochemical measurement
US-10718731-B2 · Jul 21, 2020 · US
Method, atomic force microscopy system and computer program product
US-2020227311-A1 · Jul 16, 2020 · US
Metrology technique that provides true flattening
US-10690697-B1 · Jun 23, 2020 · US
Scanning probe inspector
US-10585115-B2 · Mar 10, 2020 · US
Method and system for optimizing optical inspection of patterned structures
US-2020058118-A1 · Feb 20, 2020 · US
Thermal nanolithography method and system
US-2019361356-A1 · Nov 28, 2019 · US
Method of modifying a surface of a sample, and a scanning probe microscopy system
US-2019353681-A1 · Nov 21, 2019 · US
Debris Removal in High Aspect Structures
US-2019337025-A1 · Nov 7, 2019 · US
Electrospray imaging and deposition
US-10436815-B2 · Oct 8, 2019 · US
Dynamic sweep-plow microcantilever device and methods of use
US-10352963-B2 · Jul 16, 2019 · US
Scanning probe inspector
US-2019170788-A1 · Jun 6, 2019 · US
Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe
US-2019128824-A1 · May 2, 2019 · US
Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips
US-2019120873-A1 · Apr 25, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q80/00?
- CPC G01Q80/00 is the Cooperative Patent Classification code for “Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08).”
- How many patents are filed under CPC G01Q80/00 (Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nanostructures B82B3/00; recording or reproducing information using near-field interaction G11B9/12, G11B11/24, G11B13/08))?
- Our database includes 128 publications tagged with this CPC code.
- Is patent activity under CPC G01Q80/00 growing?
- Publication counts under this code: 15 in 2024 vs 3 in 2025 (latest complete years).