Device for measuring and/or modifying a surface
US-2024118310-A1 · Apr 11, 2024 · US
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Multiple-type SPM, i.e. involving more than one SPM techniques
Multiple-type SPM, i.e. involving more than one SPM techniques · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q60/02 |
| Official title | Multiple-type SPM, i.e. involving more than one SPM techniques |
| Display label | Multiple-type SPM, i.e. involving more than one SPM techniques |
| Total patents | 15 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2016 | 3 |
| 2020 | 5 |
| 2021 | 4 |
| 2023 | 1 |
| 2024 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Quantum-dot-based measuring system and method
US-11644479-B2 · May 9, 2023 · US
Quantum-dot-based measuring system and method
US-2021382086-A1 · Dec 9, 2021 · US
Scanning probe microscope with case and elastic body
US-11073535-B2 · Jul 27, 2021 · US
Device integrated with scanning probe for optical nanofocusing and near-field optical imaging
US-11054440-B2 · Jul 6, 2021 · US
Method for producing a probe suitable for scanning probe microscopy
US-11035880-B2 · Jun 15, 2021 · US
Scanning Probe Microscope
US-2020341027-A1 · Oct 29, 2020 · US
Device integrated with scanning probe for optical nanofocusing and near-field optical imaging
US-2020309815-A1 · Oct 1, 2020 · US
Method for Producing a Probe Suitable for Scanning Probe Microscopy
US-2020278379-A1 · Sep 3, 2020 · US
Numerically controlled rotary probe switching device based on environment-controllable atomic force microscope
US-10739377-B2 · Aug 11, 2020 · US
Numerically Controlled Rotary Probe Switching Device Based on Environment-Controllable Atomic Force Microscope
US-2020096539-A1 · Mar 26, 2020 · US
Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy
US-9395388-B2 · Jul 19, 2016 · US
System and method for providing electromagnetic imaging through electroquasistatic sensing
US-9395317-B2 · Jul 19, 2016 · US
Method of analyzing surface of sample using scanning probe microscope and scanning probe microscope therefor
US-2016169938-A1 · Jun 16, 2016 · US
Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy
US-2015241470-A1 · Aug 27, 2015 · US