Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
US-11703465-B2 · Jul 18, 2023 · US
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rocking curve analysis
rocking curve analysis · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2223/331 |
| Official title | rocking curve analysis |
| Display label | rocking curve analysis |
| Total patents | 10 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 2 |
| 2016 | 1 |
| 2017 | 1 |
| 2020 | 2 |
| 2021 | 2 |
| 2022 | 1 |
| 2023 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
US-2022065802-A1 · Mar 3, 2022 · US
X-ray inspection device
US-11079345-B2 · Aug 3, 2021 · US
X-ray inspection device
US-2021063326-A1 · Mar 4, 2021 · US
Apparatus and method for inducing high-speed variable-tilt wobble motions
US-10634626-B2 · Apr 28, 2020 · US
Apparatus and method for inducing high-speed variable-tilt wobble motions
US-2020096459-A1 · Mar 26, 2020 · US
Method of determining surface orientation of single crystal wafer
US-9678023-B2 · Jun 13, 2017 · US
Apparatus and method for detecting backlash and slip
US-9329144-B2 · May 3, 2016 · US
Apparatus and method for detecting backlash and slip
US-2015204804-A1 · Jul 23, 2015 · US
Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry
US-9001968-B2 · Apr 7, 2015 · US