Visual inspection apparatus and visual inspection method

US9933371B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9933371-B2
Application numberUS-201415103428-A
CountryUS
Kind codeB2
Filing dateJan 8, 2014
Priority dateJan 8, 2014
Publication dateApr 3, 2018
Grant dateApr 3, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A visual inspection apparatus and a visual inspection method enabling the quality of a state of solder to be properly judged. Specifically, in the visual inspection apparatus and visual inspection method, a slope (concave slope region) present on a surface of solder is searched and the quality of a state of the solder is judged based on that result. The quality of the state of the solder can be properly judged based on not a height of the solder, but the slope of the surface of the solder.

First claim

Opening claim text (preview).

The invention claimed is: 1. A visual inspection apparatus, comprising: a measurement unit that measures a three-dimensional shape of a surface of solder joining a component to a board; and a control unit that searches a first slope region, in which a distance between the surface of the solder and the board decreases toward the component, on the surface of the solder based on the measurement result of the three-dimensional shape and judges that the state of the solder is poor in the case of detecting the first slope region larger than a predetermined area based on a result of searching the first slope region. 2. The visual inspection apparatus according to claim 1 , wherein the control unit searches the first slope region satisfying a search condition that an inclination direction is within a predetermined inclination angle range. 3. The visual inspection apparatus according to claim 1 , wherein the control unit searches the first slope region satisfying a search condition that a gradient angle is within a predetermined gradient angle range. 4. The visual inspection apparatus according to claim 1 , further comprising a setting unit that sets the search condition of the first slope region according to a content input from a user. 5. The visual inspection apparatus according to claim 1 , wherein the control unit searches a second slope region, in which the distance between the surface of the solder and the board increases toward the component, from the surface of the solder based on the measurement result of the three-dimensional shape and judges that the state of the solder is poor in the case of detecting no second slope region larger than a predetermined area based on a result of searching the second slope region. 6. The visual inspection apparatus according to claim 1 , wherein: the measurement unit includes an irradiator to irradiate light to the surface of the solder and a photodetector and performs a light detecting operation of detecting light irradiated from the irradiator and reflected by the surface of the solder by the photodetector and obtaining a light detection result; and the control unit calculates the three-dimensional shape based on the light detection result. 7. The visual inspection apparatus according to claim 6 , wherein the control unit calculates the three-dimensional shape based on a result of searching a reflected light that is incident on the solder after being emitted from the irradiator and reflected. 8. The visual inspection apparatus according to claim 7 , wherein: the measurement unit includes a plurality of the irradiators, makes each irradiator individually light to perform the light detecting operation, and obtains the light detection result for each irradiator; and the control unit calculates the three-dimensional shape based on a result of specifying the irradiator irradiating the reflected light in the case of detecting the reflected light. 9. The visual inspection apparatus according to claim 8 , wherein the control unit calculates a height at a position of reflection where the reflected light is incident while excluding the light detection result obtained by lighting the irradiator irradiating the reflected light whose quantity is larger than a predetermined light quantity in calculating a distance between the position of reflection and the board to calculate the three-dimensional shape. 10. A visual inspection method, comprising: measuring a three-dimensional shape of a surface of solder joining a component to a board; searching a slope region, in which a distance between the surface of the solder and the board decreases toward the component, on the surface of the solder based on the measurement result of the three-dimensional shape; and judging that a state of the solder is poor in the case of detecting the slope region larger than a predetermined area based on a result of searching the slope region.

Assignees

Inventors

Classifications

  • Inspecting patterns on the surface of objects {(contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H10P74/20)} · CPC title

  • using several gratings, projected with variable angle of incidence on the object, and one detection device · CPC title

  • Monitoring a manufacturing process · CPC title

  • having edge contacts, e.g. leadless chip capacitors, chip carriers · CPC title

  • Soldering of electronic components · CPC title

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What does patent US9933371B2 cover?
A visual inspection apparatus and a visual inspection method enabling the quality of a state of solder to be properly judged. Specifically, in the visual inspection apparatus and visual inspection method, a slope (concave slope region) present on a surface of solder is searched and the quality of a state of the solder is judged based on that result. The quality of the state of the solder can be…
Who is the assignee on this patent?
Yamaha Motor Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N21/95. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 03 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).