Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same
US-9991174-B2 · Jun 5, 2018 · US
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Lee Jihye patents in 2018
Lee Jihye was listed as an assignee on 1 patent publication in 2018.
| Metric | Value |
|---|---|
| Company | Lee Jihye |
| Year | 2018 |
| Patents | 1 |
Patents
Representative publications for Lee Jihye in 2018.
Top CPC classifications
Most common classification codes for Lee Jihye in 2018.
| CPC | Patents |
|---|---|
| G01B2210/56 | 1 |
| G01N21/9501 | 1 |
| G01N21/95607 | 1 |
| G01N21/95684 | 1 |
| H01J2237/24578 | 1 |
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