Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same
US-9991174-B2 · Jun 5, 2018 · US
Lee Jihye holds 7 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 7 |
| Recent patents | 0 |
| First publication | Feb 17, 2015 |
| Latest publication | Jun 5, 2018 |
Year-over-year patent counts for this assignee.
Latest publications where this party is an assignee.
US-9991174-B2 · Jun 5, 2018 · US
US-9756556-B2 · Sep 5, 2017 · US
US-9288541-B2 · Mar 15, 2016 · US
US-9014055-B2 · Apr 21, 2015 · US
US-9001762-B2 · Apr 7, 2015 · US
Representative or frequently cited publications from precomputed assignee stats.
US-9991174-B2 · Jun 5, 2018 · US
US-9756556-B2 · Sep 5, 2017 · US
US-9288541-B2 · Mar 15, 2016 · US
US-9014055-B2 · Apr 21, 2015 · US
US-9001762-B2 · Apr 7, 2015 · US
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Electricity | 7 |
| Physics | 2 |
Answers are generated from the same data shown on this page.