Method of measuring an adhesive force of interlayer adhesive layer in tensile mode for stacked semiconductor device and apparatus for measuring the same
US-2018195951-A1 · Jul 12, 2018 · US
Industry Academic Cooperation Foundation Yeungnam Univ was listed as an assignee on 2 patent publications in 2018.
| Metric | Value |
|---|---|
| Company | Industry Academic Cooperation Foundation Yeungnam Univ |
| Year | 2018 |
| Patents | 2 |
Representative publications for Industry Academic Cooperation Foundation Yeungnam Univ in 2018.
US-2018195951-A1 · Jul 12, 2018 · US
US-9945772-B2 · Apr 17, 2018 · US
Most common classification codes for Industry Academic Cooperation Foundation Yeungnam Univ in 2018.
| CPC | Patents |
|---|---|
| G01M1/00 | 2 |
| G01N19/04 | 2 |
| G01N2203/0017 | 2 |
| G01N2203/0025 | 2 |
| H10P74/203 | 2 |
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