Three layer stack structure

Patent metadata

Field	Value
Publication number	US-9935087-B2
Application number	US-201715405046-A
Country	US
Kind code	B2
Filing date	Jan 12, 2017
Priority date	Apr 23, 2015
Publication date	Apr 3, 2018
Grant date	Apr 3, 2018

Abstract

Vertically stacked system in package structures are described. In an embodiment, a package includes a first level molding and fan out structure, a third level molding and fan out structure, and a second level molding and fan out structure between the first and third levels. The second level molding and fan out structure includes back-to-back facing die, with a front surface of each die bonded to a redistribution layer.

First claim

What is claimed is:

1. A vertical stack system in package (SiP) comprising:
a pair of first level dies encapsulated in a first level molding compound;
a first redistribution layer (RDL) on the encapsulated pair of first level dies;
a second level die stack including a pair of back-to-back stacked dies on the first RDL and encapsulated in a second level molding compound;
a second RDL on the encapsulated second level die stack;
a third level die on the second RDL and encapsulated in a third level molding compound, wherein the third level die is back facing toward the second RDL, wherein the third level die is attached directly to the second RDL with a die attach film that is in direct contact with the third level die and the second RDL; and
a third RDL on the encapsulated third level die;
wherein each of the first level dies is a first type of die and each of the back-to-back stacked dies is a second type of die that is different than the first type of die, and each of the back-to-back stacked dies have larger x-y dimensions than each of the first level dies.

2. The vertical stack SiP of claim 1 , wherein the third RDL is directly on a stud bump of the third level die.

3. The vertical stack SiP of claim 1 , wherein the third RDL is directly on a contact pad of the third level die.

4. The vertical stack SiP of claim 1 , wherein each of the first level dies is front facing toward the first RDL and the first RDL is directly on a conductive bump for each of the first level dies.

5. The vertical stack SiP of claim 1 , wherein the pair of back-to-back stacked dies includes a first-second level die bonded to the first RDL, and a second-second level die, wherein the second RDL is on the second-second level die.

6. The vertical stack SiP of claim 5 , wherein the first-second level die is bonded to the first RDL with solder.

7. The vertical stack SiP of claim 6 , wherein the second RDL is directly on a stud bump of the second-second level die.

8. The vertical stack SiP of claim 5 , further comprising a plurality of second level conductive pillars extending from the first RDL to the second RDL, wherein the plurality of second level conductive pillars are encapsulated with the second level molding compound.

9. The vertical stack SiP of claim 8 , further comprising a plurality of third level conductive pillars extending from the second RDL to the third RDL, wherein the plurality of third level conductive pillars are encapsulated with the third level molding compound.

10. The vertical stack SiP of claim 9 , further comprising a plurality of conductive bumps on an opposite side of the third RDL from the third level die.

11. The vertical stack SiP of claim 9 , further comprising:
a plurality of first level conductive pillars extending through the first level molding compound; and
a second package on the first level molding compound, and electrically connected with the plurality of first level conductive pillars.

12. The vertical stack SiP of claim 1 , wherein the pair of back-to-back stacked dies includes a first-second level die bonded to the first RDL, and a second-second level die,
wherein the first-second level die is bonded to the first RDL with solder and the second RDL is directly on a stud bump of the second-second level die.

13. The vertical stack SiP of claim 1 , wherein the third level die is a third type of die that is different than both the first type of die and the second type of die.

14. The vertical stack SiP of claim 1 wherein:
the first type of die is selected from the group consisting of DRAM, SRAM, pseudo SRAM, and floating body;
the second type of die is selected from the group consisting of NAND, NOR, EPROM, EEPROM, MRAM, FRAM, and PCM; and
the third type of die is selected from the group consisting of ASIC and SoC.

Assignees

• Apple Inc

Inventors

• Zhai Jun
• Hu Kunzhong

Classifications

• H10W90/722

  between stacked chips · CPC title

• H10W72/0198

  batch processes · CPC title

• H10W70/099

  Connecting interconnections to insulating or insulated package substrates, interposers or redistribution layers · CPC title

• H10W72/072

  of bump connectors · CPC title

• H10W74/15

  on active surfaces of flip-chip devices, e.g. underfills · CPC title