Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Patent metadata

Field	Value
Publication number	US-9927718-B2
Application number	US-201113186144-A
Country	US
Kind code	B2
Filing date	Jul 19, 2011
Priority date	Aug 3, 2010
Publication date	Mar 27, 2018
Grant date	Mar 27, 2018

Abstract

A multi-layer overlay target for use in imaging based metrology is disclosed. The overlay target includes a plurality of target structures including three or more target structures, each target structure including a set of two or more pattern elements, wherein the target structures are configured to share a common center of symmetry upon alignment of the target structures, each target structure being invariant to N degree rotation about the common center of symmetry, wherein N is equal to or greater than 180 degrees, wherein each of the two or more pattern elements has an individual center of symmetry, wherein each of the two or more pattern elements of each target structure is invariant to M degree rotation about the individual center of symmetry, wherein M is equal to or greater than 180 degrees.

First claim

What is claimed:

1. A multilayer overlay target, comprising:
a plurality of target structures including three or more target structures, the three or more target structures including a first target structure, a second target structure and at least a third target structure, wherein at least some of the target structures include a set of two or more pattern elements, wherein the three or more target structures are configured to share a common center of symmetry upon alignment of the three or more target structures, wherein at least one of the target structures is invariant to 90 degree rotation about the common center of symmetry, wherein the first target structure is disposed in a first process layer, wherein the second target structure is disposed in a second process layer different from the first process layer, wherein at least the third target structure is disposed in at least a third process layer, the at least a third process layer different from the first process layer and the second process layer, wherein a first particular pattern element of the set of two or more pattern elements includes three or more sub-elements and at least a second particular pattern element of the set of two or more pattern elements includes three or more sub-elements, wherein at least one of the three or more sub-elements of the first particular pattern element or the three or more sub-elements of the at least the second particular pattern element comprise a set of three or more parallel line structures aligned along a selected direction and distributed along a direction orthogonal to the selected direction.

2. The multilayer overlay target of claim 1 , wherein a first pattern element of the set of two or more pattern elements is suitable for overlay metrology measurements in a first direction and a second pattern element of the set of two or more pattern elements is suitable for overlay metrology measurements in a second direction different from the first direction.

3. The multilayer overlay target of claim 1 , wherein a set of pattern elements suitable for overlay metrology measurements in a first direction and a second set of pattern elements suitable for overlay metrology measurements in a second direction different from the first direction have a common center of symmetry.

4. The multilayer overlay target of claim 1 , wherein the set of two or more pattern elements of each target structure are printed above or below a layer of dummy fill.

5. The multilayer overlay target of claim 1 , wherein some of the plurality of target structures include an additional set of pattern elements in order to enhance contrast of the some of the plurality of target structures.

6. The multilayer overlay target of claim 1 , wherein at least some of the two or more pattern elements of each target structure are invariant to 180 degree rotation about an individual center of symmetry and variant to 90 degree rotation about the individual center of symmetry.

7. The multilayer overlay target of claim 1 , wherein the first target structure is invariant to 90 degrees rotation about the common center of symmetry, wherein the second target structure and at least the third target structure are invariant to 180 degrees rotation about the common center of symmetry and variant to 90 degrees rotation about the common center of symmetry.

8. The multilayer overlay target of claim 1 , wherein the first target structure is configured to measure overlay in a first direction and a second direction perpendicular to the first direction, wherein the second target structure is configured to measure overlay in the first direction and the third target structure is configured to measure overlay in the second direction.

9. The multilayer overlay target of claim 1 , wherein the first target structure is invariant to 90 degree rotation about a common center of symmetry, wherein at least one of the second target structure or the third target structure is invariant to 180 degree rotation about the common center of symmetry and variant to 90 degree rotation about the common center of symmetry, wherein each of the two or more pattern elements of each target structure is invariant to 180 degree rotation about an individual center of symmetry and variant to 90 degree rotation about the individual center of symmetry.

10. The multilayer overlay target of claim 1 , wherein the three or more sub-elements are arranged parallel to a spacing of the at least one of the pattern elements.

11. The multilayer overlay target of claim 1 , wherein the three or more sub-elements are arranged perpendicular to a spacing of the at least one of the pattern elements.

12. The multilayer overlay target of claim 1 , wherein the three or more sub-elements are arranged parallel to a first spacing of the at least one of the pattern elements and perpendicular to a second spacing of the at least one of the pattern elements.

13. The multilayer overlay target of claim 1 , wherein a spacing associated with the three or more sub-elements is smaller than a spacing between the two or more of the pattern elements.

14. The multilayer overlay target of claim 1 , wherein at least some of the two or more pattern elements have an individual center of symmetry.

15. A multilayer overlay target, comprising:
a plurality of target structures including three or more target structures, the three or more target structures including a first target structure, a second target structure and at least a third target structure, wherein at least some of the target structures include a set of two or more pattern elements, wherein the three or more target structures are configured to share a common center of symmetry upon alignment of the three or more target structures, wherein the first target structure is invariant to a 90 degree rotation about the common center of symmetry, the second target structure is invariant to a 90 degree rotation about the common center of symmetry, and at least the third target structure is invariant to a 90 degree rotation about the common center of symmetry, wherein the first target structure is disposed in a first process layer, wherein the second target structure is disposed in a second process layer different from the first process layer, wherein at least the third target structure is disposed in at least a third process layer, the at least a third process layer different from the first process layer and the second process layer, wherein at least some of the two or more pattern elements have an individual center of symmetry different from the common center of symmetry of the three or more target structures, wherein at least a portion of a pattern element of the first target structure overlaps with at least a portion of a pattern element of at least one of the second target structure or the at least a third target structure.

16. The multilayer overlay target of claim 15 , wherein the three or more target structures include at least a fourth target structure.

17. The multilayer overlay target of claim 16 , wherein at least the fourth target structure is invariant to a 90 degree rotation about the common center of symmetry.

18. The multilayer overlay target of claim 17 , wherein the first target structure, the second target structure, the third target structure and the fourth target structure are configured to measure overlay in a first direction and a second direction perpendicular to the first direction.

19. The multilayer overlay target of claim 15 , wherein one or more pattern elements of the first target structure overlaps with one or more pattern elem

Assignees

• Kandel Daniel
• Levinski Vladimir
• Cohen Guy
• Kla Tencor Corp

Inventors

• Kandel Daniel
• Levinski Vladimir
• Cohen Guy

Classifications

• H10P72/53

  using optical controlling means · CPC title

• G03F7/70633 Primary

  Overlay, i.e. relative alignment between patterns printed by separate exposures in different layers, or in the same layer in multiple exposures or stitching · CPC title

• G03F9/7088

  Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection · CPC title

• G03F7/70683

  Mark designs · CPC title

• G03F7/706845

  Calibration, e.g. tool-to-tool calibration, beam alignment, spot position or focus · CPC title