Integrated circuit devices having air-gap spacers above gate electrodes

Patent metadata

Field	Value
Publication number	US-9911851-B2
Application number	US-201615079623-A
Country	US
Kind code	B2
Filing date	Mar 24, 2016
Priority date	Jan 28, 2014
Publication date	Mar 6, 2018
Grant date	Mar 6, 2018

Abstract

Integrated circuit devices having a cavity and methods of manufacturing the integrated circuit devices are provided. The integrated circuit devices may include a pair of spacers, which define a recess. The integrated circuit device may also include a lower conductive pattern in the recess and an upper conductive pattern on the lower conductive pattern. The upper conductive pattern may have an etch selectivity with respect to the lower conductive pattern and may expose an upper surface of the lower conductive pattern adjacent a sidewall of the upper conductive pattern. An inner sidewall of one of the pair of spacers, the upper surface of the lower conductive pattern and the sidewall of the upper conductive pattern may define a space and a capping pattern may be formed on the upper conductive pattern to seal a top portion of the space, such that a cavity is disposed under the capping pattern.

First claim

What is claimed is:

1. A field effect transistor comprising:
a substrate comprising a fin extending longitudinally in a first direction;
a gate electrode crossing over the fin and extending longitudinally in a second direction that is different from the first direction, wherein the gate electrode comprises a lower gate electrode and an upper gate electrode that are sequentially stacked on the substrate, wherein the lower gate electrode has a first width in the first direction, the upper gate electrode has a second width in the first direction, and the first width is greater than the second width, and wherein the upper gate electrode exposes an upper surface of the lower gate electrode;
a capping pattern on the gate electrode, the capping pattern extending longitudinally in the second direction, and a lower surface of the capping pattern directly contacting an upper surface of the upper gate electrode; and
a cavity between the gate electrode and the capping pattern, the cavity extending longitudinally in the second direction, and the lower surface of the capping pattern and the upper surface of the lower gate electrode defining the cavity.

2. The field effect transistor of claim 1 , wherein the capping pattern comprises silicon nitride, silicon oxynitride and/or silicon oxide.

3. The field effect transistor of claim 2 , wherein the cavity comprises an air-gap.

4. The field effect transistor of claim 2 , further comprising an insulating pattern in the cavity.

5. The field effect transistor of claim 4 , wherein the insulating pattern comprises SiCN, SiBCN or SiOCN.

6. The field effect transistor of claim 1 , wherein the upper gate electrode has an etch selectivity with respect to the lower gate electrode.

7. The field effect transistor of claim 1 , wherein a distance between the upper surface of the lower gate electrode and the lower surface of the capping pattern is uniform along the second direction.

8. The field effect transistor of claim 1 , wherein the gate electrode comprises opposing sidewalls that extend in the second direction,
wherein the field effect transistor further comprises a first spacer and a second spacer, and the first and second spacers extend on the opposing sidewalls of the gate electrode, respectively, and
wherein a portion of the capping pattern is between the first and second spacers, and the lower surface of the capping pattern is lower than uppermost surfaces of the first and second spacers relative to the substrate.

Assignees

• Seo Kang Ill
• Lee Jin Wook
• Samsung Electronics Co Ltd

Inventors

• Seo Kang Ill
• Lee Jin Wook

Classifications

• H10W20/40

  Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes · CPC title

• H01L23/485

  Electricity · mapped topic

• H01L21/823468

  Electricity · mapped topic

• H01L29/4983

  Electricity · mapped topic

• H01L27/088

  Electricity · mapped topic