Light-emitting device test systems

Patent metadata

Field	Value
Publication number	US-9874597-B2
Application number	US-201514696891-A
Country	US
Kind code	B2
Filing date	Apr 27, 2015
Priority date	Apr 30, 2014
Publication date	Jan 23, 2018
Grant date	Jan 23, 2018

Abstract

Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.

First claim

What is claimed is:

1. A test system comprising:
a photometric testing unit having a body around a cavity, wherein the body defines an inlet and an outlet;
a conveyor that projects through the photometric testing unit, wherein the conveyor is disposed in the inlet and the outlet, and wherein the conveyor is configured to move continuously at one or more speeds greater than zero;
a spectrometer connected to the photometric testing unit, wherein the spectrometer is configured to measure a flux of one of a plurality of devices on the conveyor in the cavity of the photometric testing unit; and
an electrical connection configured to power one of the devices disposed on the conveyor belt in the cavity of the photometric testing unit while the conveyor is in motion, wherein the electrical connection comprises a probe card configured to make a four-point contact with one of the devices on the conveyor, the probe card including an anode current roller pad, an anode voltage roller pad, a cathode current roller pad, and a cathode voltage roller pad, wherein the anode current roller pad and the anode voltage roller pad connect to an anode contact on one of the devices on the conveyor, and wherein the cathode current roller pad and the cathode voltage roller pad connect to a cathode contact on one of the devices on the conveyor.

2. The test system of claim 1 , wherein the photometric testing unit comprises an integrating sphere.

3. The test system of claim 1 , further comprising a second conveyor that projects through the inlet and the outlet of the photometric testing unit.

4. The test system of claim 1 , further comprising a controller connected to the spectrometer, wherein the controller is configured to calculate the flux, and wherein the controller is configured to calibrate for light loss through the outlet, through the inlet, and due to presence of the conveyor.

5. The test system of claim 1 , wherein the devices comprise LEDs and wherein the conveyor further comprises a spring-loaded edge grip configured to hold the LEDs on the conveyor.

6. The test system of claim 1 , further comprising a first pick and place robot upstream of the photometric testing unit and a second pick and place robot downstream of the photometric testing unit, wherein the first pick and place robot is configured to place the devices on the conveyor and the second pick and place robot is configured to remove the devices from the conveyor.

7. The test system of claim 1 , wherein the conveyor is configured to move at a constant speed.

8. The test system of claim 1 , further comprising a heating device configured to heat the devices on the conveyor.

Assignees

• Kla Tencor Corp
• Kla-Tenor Corp

Inventors

• Mccord Mark
• Brodie Alan
• George James
• Guan Yu
• Nyffenegger Ralph

Classifications

• G01R31/2635 Primary

  Testing light-emitting diodes, laser diodes or photodiodes · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title