System and method for scanning electron beam image-formation with elemental analysis
US-2026036535-A1 · Feb 5, 2026 · US
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Nyffenegger Ralph patents
Nyffenegger Ralph is listed as an inventor on 12 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Nyffenegger Ralph |
| Total patents | 12 |
| First publication | Mar 5, 2015 |
| Latest publication | Feb 5, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Electron beam inspections with high sensitivity and throughput
US-2025357068-A1 · Nov 20, 2025 · US
Creating multiple electron beams with a photocathode film
US-12283453-B2 · Apr 22, 2025 · US
Method and system of image-forming multi-electron beams
US-12165831-B2 · Dec 10, 2024 · US
Tilt-column multi-beam electron microscopy system and method
US-12068129-B2 · Aug 20, 2024 · US
Tilt-column multi-beam electron microscopy system and method
US-2024153737-A1 · May 9, 2024 · US
Method and system of image-forming multi-electron beams
US-2024096586-A1 · Mar 21, 2024 · US
Creating Multiple Electron Beams with a Photocathode Film
US-2023395349-A1 · Dec 7, 2023 · US
Light-emitting device test systems
US-9874597-B2 · Jan 23, 2018 · US
Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions
US-9746514-B2 · Aug 29, 2017 · US
Recent patents
Latest publications not already listed above.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 8 |
| Kla Tencor Corp | 4 |
| Kla-Tenor Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 7 |
| H01J2237/0492 | 6 |
| H01J2237/2448 | 5 |
| H01J37/12 | 4 |
| H01J2237/103 | 4 |