Method of manufacturing printed circuit board
US-2024414849-A1 · Dec 12, 2024 · US
US9839124B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9839124-B2 |
| Application number | US-201615015551-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 4, 2016 |
| Priority date | Feb 6, 2015 |
| Publication date | Dec 5, 2017 |
| Grant date | Dec 5, 2017 |
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Provided is a copper foil provided with a carrier in which the laser hole-opening properties of the ultrathin copper layer are good and which is suitable for producing a high-density integrated circuit substrate. A copper foil provided with a carrier having, in order, a carrier, an intermediate layer, and an ultrathin copper layer, wherein the specular gloss at 60° in an MD direction of the intermediate layer side surface of the ultrathin copper layer is 140 or less.
Opening claim text (preview).
The invention claimed is: 1. A copper foil provided with a carrier comprising, in order, a carrier, an intermediate layer, and an ultrathin copper layer, wherein at least one of the following (a) and (b) is satisfied: (a) a specular gloss at 60° in a machine direction (MD) of the intermediate layer side surface of the ultrathin copper layer is 140 or less; (b) a specular gloss at 60° in a transverse direction (TD) of the intermediate layer side surface of the ultrathin copper layer is 65 or less, wherein a ten point average roughness Rz in the MD direction of the intermediate layer side surface of the ultrathin copper layer measured using a contact roughness meter is 1.5 μm or less. 2. The copper foil provided with a carrier according to claim 1 , wherein a ten point average roughness Rz in the MD direction of the intermediate layer side surface of the ultrathin copper layer measured using a contact roughness meter is 0.80 μm or more. 3. The copper foil provided with a carrier according to claim 1 , wherein a ten point average roughness Rz in the TD direction of the intermediate layer side surface of the ultrathin copper layer measured using a contact roughness meter is 1.7 μm or less. 4. The copper foil provided with a carrier according to claim 1 , wherein a ten point average roughness Rz in the MD direction of the intermediate layer side surface of the ultrathin copper layer measured using a contact roughness meter/a ten point average roughness Rz in the TD direction of the intermediate layer side surface of the ultrathin copper layer measured using a contact roughness meter is 0.55 or more. 5. The copper foil provided with a carrier according to claim 1 , comprising a resin layer provided above the ultrathin copper layer. 6. A laminate fabricated using a copper foil provided with a carrier according to claim 1 . 7. A laminate comprising a copper foil provided with a carrier according to claim 1 and a resin, wherein a part or all of an edge face of the copper foil provided with a carrier is covered with the resin. 8. A laminate, wherein one copper foil provided with a carrier according to claim 1 is laminated from the carrier side or the ultrathin copper layer side on the carrier side or the ultrathin copper layer side of another copper foil provided with a carrier according to claim 1 .
Blind plated via connections (H05K3/422, H05K3/423 and H05K3/425 take precedence) · CPC title
of copper · CPC title
containing more than 50% by weight of iron or nickel or cobalt · CPC title
Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites · CPC title
Surface contacts, e.g. bumps (H05K3/4092 takes precedence; deposition of finish layers on pads H05K3/24; forming solder bumps H05K3/3465) · CPC title
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