Pattern forming method and actinic-ray- or radiation-sensitive resin composition

US9760003B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9760003-B2
Application numberUS-201113642751-A
CountryUS
Kind codeB2
Filing dateMay 20, 2011
Priority dateMay 25, 2010
Publication dateSep 12, 2017
Grant dateSep 12, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a method of forming a pattern and an actinic-ray- or radiation-sensitive resin composition that excels in the limiting resolving power, roughness characteristics, exposure latitude (EL) and bridge defect performance. The method of forming a pattern includes (1) forming an actinic-ray- or radiation-sensitive resin composition into a film, (2) exposing the film to light, and (3) developing the exposed film with a developer containing an organic solvent. The actinic-ray- or radiation-sensitive resin composition contains (A) a resin containing a repeating unit with a structural moiety that is configured to decompose when exposed to actinic rays or radiation to thereby generate an acid, and (B) a solvent.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of forming a negative pattern, comprising: (1) forming an actinic-ray- or radiation-sensitive resin composition into a film, (2) exposing the film to light, and (3) developing the exposed film with a developer containing a polar solvent as an organic solvent, the actinic-ray- or radiation-sensitive resin composition comprising: (A) a resin containing a repeating unit with a structural moiety that is configured to decompose when exposed to actinic rays or radiation to thereby generate an acid of any general formulae (III) to (VII) below, and (B) a solvent, wherein said resin (A) further contains a repeating unit with an acid decomposable group, and wherein an amount of the organic solvent used in the developer is in the range of 80 to 100 mass %, in which each of R 04 , R 05 and R 07 to R 09 independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, a halogen atom, a cyano group or an alkoxycarbonyl group, R 06 represents a cyano group, a carboxyl group, —CO—OR 25 or —CO—N(R 26 )(R 27 ), provided that when R 06 is —CO—N(R 26 )(R 27 ), R 26 and R 27 may be bonded to each other to thereby form a ring in cooperation with N atom, each of X 1 to X 3 independently represents a single bond, or an arylene group, an alkylene group, a cycloalkylene group, —O—, —SO 2 —, —CO—, —N(R 33 )— or a bivalent connecting group composed of a combination of these, R 25 represents an alkyl group, a cycloalkyl group, an alkenyl group, a cycloalkenyl group, an aryl group or an aralkyl group, each of R 26 , R 27 and R 33 independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, an alkenyl group, a cycloalkenyl group, an aryl group or an aralkyl group, W represents —O—, —S— or a methylene group, l is 0 or 1, and A represents a structural moiety that is configured to decompose when exposed to actinic rays or radiation to thereby generate an acid, wherein the structural moiety has a nonionic structure. 2. The method according to claim 1 , wherein the structural moiety has an oxime structure. 3. The method according to claim 1 , wherein the structural moiety has a structure that generates an acid group on a side chain of the resin when exposed to actinic rays or radiation. 4. The method according to claim 1 , wherein said acid decomposable group is a group that is configured to decompose when acted on by an acid to thereby produce an alcoholic hydroxyl group. 5. The method according to claim 1 , wherein said repeating unit with an acid decomposable group is represented by general formula (AI) below, in which Xa 1 represents a hydrogen atom, a methyl group, or a group represented by —CH 2 —R 9 in which R 9 represents a hydroxyl group or a monovalent organic group, T represents a single bond or a bivalent connecting group, and each of Rx 1 to Rx 3 independently represents a linear or branched alkyl group or a monocyclic or polycyclic cycloalkyl group, provided that at least two of Rx 1 to Rx 3 may be bonded to each other to thereby form a monocyclic or polycyclic cycloalkyl group. 6. The method according to claim 1 , wherein the composition further comprises a hydrophobic resin. 7. The method according to claim 6 , wherein a content of the hydrophobic resin in the composition based on total solids thereof is in the range of 0.01 to 10 mass %. 8. The method according to claim 6 , wherein the hydrophobic resin contains at least one of fluorine atom and silicon atom. 9. The method according to claim 1 , wherein the exposure is performed through an immersion liquid. 10. The method according to claim 1 , wherein the developer containing a polar solvent as an organic solvent is a developer containing an ester solvent. 11. The method according to claim 10 , wherein the ester solvent is a butyl acetate. 12. The method according to claim 1 , further comprising: (4) rinsing the developed film with a rinse liquid containing an organic solvent. 13. The method according to claim 1 , wherein said resin (A) further contains a repeating unit containing a lactone structure. 14. The method according to claim 13 , wherein said repeating unit containing a lactone structure is represented by the following general formula (AII′): wherein, Rb 0 represents a hydrogen atom, a halogen atom or an alkyl group having 1 to 4 carbon atoms, and V represents any of the groups of general formulae (LC1-1) to (LC1-17), wherein, Rb 2 represents a substituent, and n2 is an integer of 0 to 2. 15. The method according to claim 1 , wherein said resin (A) further contains a repeating unit containing a hydroxyl group or a cyano group, represented by any of general formulae (Alla) to (AIId) below, wherein, R 1 C represents a hydrogen atom, a methyl group, a trifluoromethyl group or a hydroxymethyl group, and each of R 2C to R 4C independently represents a hydrogen atom, a hydroxyl group or a cyano group, with the proviso that at least one of the R 2C to R 4C represents a hydroxy group or a cyano group. 16. The method according to claim 1 , wherein the content ratio of the resin based on the total solid content of the whole composition is in the range of 60 to 95 mass %. 17. A method of forming a negative pattern, comprising: (1) forming an actinic-ray- or radiation-sensitive resin composition into a film, (2) exposing the film to light, and (3) developing the exposed film with a developer containing a polar solvent as an organic solvent, wherein said polar solvent contains at least an ester solvent or a ketone solvent, the actinic-ray- or radiation-sensitive resin composition comprising: (A) a resin containing a repeating unit with a structural moiety that is configured to decompose when exposed to actinic rays or radiation to thereby generate an acid of any general formulae (III) to (VII) below, and (B) a solvent, wherein said resin (A) further contains a repeating unit with an acid decomposable group, and wherein an amount of the organic solvent used in the developer is in the range of 80 to 100 mass %, in which each of R 04 , R 05 and R 07 to R 09 independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, a halogen atom, a cyano group or an alkoxycarbonyl group, R 06 represents a cyano group, a carboxyl group, —CO—OR 25 or —CO—N(R 26 )(R 27 ), provided that when R 06 is —CO—N(R 26 )(R 27 ), R 26 and R 27 may be bonded to each other to thereby form a ring in cooperation with N atom, each of X 1 to X 3 independently represents a single bond, or an arylene group, an alkylene group, a cycloalkylene group, —O—, —SO 2 —, —CO—, —N(R 33 )—

Assignees

Inventors

Classifications

  • Treatment after imagewise removal, e.g. baking · CPC title

  • Non-aqueous compositions · CPC title

  • Structurally defined web or sheet [e.g., overall dimension, etc.] · CPC title

  • having cover layers or intermediate layers, e.g. subbing layers {(G03F7/091 - G03F7/093, B41N3/03 take precedence)} · CPC title

  • with silicon- containing groups in the side chains · CPC title

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What does patent US9760003B2 cover?
Provided is a method of forming a pattern and an actinic-ray- or radiation-sensitive resin composition that excels in the limiting resolving power, roughness characteristics, exposure latitude (EL) and bridge defect performance. The method of forming a pattern includes (1) forming an actinic-ray- or radiation-sensitive resin composition into a film, (2) exposing the film to light, and (3) devel…
Who is the assignee on this patent?
Iwato Kaoru, Takahashi Hidenori, Hirano Shuji, and 3 more
What technology area does this patent fall under?
Primary CPC classification G03F7/0045. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 12 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).