Vacuum pressure gauge

Patent metadata

Field	Value
Publication number	US-9726566-B2
Application number	US-201514699409-A
Country	US
Kind code	B2
Filing date	Apr 29, 2015
Priority date	Apr 29, 2015
Publication date	Aug 8, 2017
Grant date	Aug 8, 2017

Abstract

A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.

First claim

What is claimed:

1. A vacuum pressure gauge, comprising:
an ion trap configured to trap antimatter therein in a vacuum chamber; and
a controller configured to:
determine a lifetime of the antimatter trapped in the ion trap; and
determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.

2. The vacuum pressure gauge of claim 1 , wherein the lifetime of the antimatter trapped in the ion trap corresponds to an annihilation rate of the antimatter trapped in the ion trap.

3. The vacuum pressure gauge of claim 2 , wherein the controller is configured to determine the annihilation rate of the antimatter trapped in the ion trap by:
determining a quantity of antimatter ions trapped in the ion trap at an initial time; and
determining a quantity of antimatter ions trapped in the ion trap at a subsequent time.

4. The vacuum pressure gauge of claim 1 , wherein the pressure gauge includes a positron source configured to load the antimatter into the ion trap.

5. The vacuum pressure gauge of claim 4 , wherein the pressure gauge includes a tungsten moderator through which the positron source is configured to load the antimatter into the ion trap.

6. The vacuum pressure gauge of claim 4 , wherein the controller is configured to, upon the antimatter being loaded into the ion trap:
prevent the positron source from loading additional antimatter into the ion trap; and
apply a voltage to the ion trap to trap the antimatter in the ion trap.

7. The vacuum pressure gauge of claim 1 , wherein the controller is configured to determine the pressure in the vacuum chamber based on a linear relationship between the lifetime of the antimatter and the pressure in the vacuum chamber.

8. A method of determining pressure in a vacuum chamber, comprising:
determining, by a controller of a vacuum pressure gauge, a lifetime of antimatter trapped in an ion trap in a vacuum chamber; and
determining, by the controller, a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.

9. The method of claim 8 , wherein determining the pressure in the vacuum chamber includes:
determining a quantity of particles in the vacuum chamber based on the determined lifetime of the antimatter; and
determining the pressure in the vacuum chamber based on the determined quantity of particles.

10. The method of claim 8 , wherein determining the lifetime of the antimatter trapped in the ion trap includes:
amplifying an electronic signal induced in the ion trap by the antimatter; and
determining a quantity of antimatter ions trapped in the ion trap based on a frequency bandwidth of the amplified electronic signal.

11. The method of claim 10 , wherein the frequency bandwidth of the amplified electronic signal is proportional to the quantity of antimatter ions trapped in the ion trap.

12. The method of claim 10 , wherein the method includes amplifying the electronic signal induced in the ion trap using an amplifier of a vacuum pressure gauge.

13. The method of claim 8 , wherein the method includes removing any remaining antimatter from the ion trap upon determining the pressure in the vacuum chamber.

14. A vacuum pressure gauge, comprising:
an ion trap configured to trap antimatter therein in a vacuum chamber; and
a controller configured to:
determine a lifetime of the antimatter trapped in the ion trap;
determine a quantity of particles in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter; and
determine a pressure in the vacuum chamber based, at least in part, on the determined quantity of particles.

15. The vacuum pressure gauge of claim 14 , wherein the lifetime of the antimatter trapped in the ion trap corresponds to an amount of time before the antimatter trapped in the ion trap is annihilated by the particles in the vacuum chamber.

16. The vacuum pressure gauge of claim 14 , wherein the lifetime of the antimatter trapped in the ion trap is inversely proportional to the quantity of particles in the vacuum chamber.

17. The vacuum pressure gauge of claim 14 , wherein the antimatter trapped in the ion trap includes a number of positrons.

18. The vacuum pressure gauge of claim 14 , wherein the ion trap is a Penning trap.

19. The vacuum pressure gauge of claim 14 , wherein the vacuum pressure gauge includes a vacuum flange connected to the ion trap and inserted into the vacuum chamber.

Assignees

• Honeywell Int Inc

Inventors

• Dorr Joshua

Classifications

• G01L21/36

  using radioactive substances · CPC title

• G01L21/30 Primary

  by making use of ionisation effects · CPC title

• G01L19/0636

  using particle filters · CPC title